• Szawcow, Oliwia
• Socha, Robert
• Witkowski, Marcin
• Ostapko, Jakub
• Starowicz, Zbigniew
• Haras, Maciej
• Zięba, Adam
• Adamczyk-Cieślak, Bogusława
• Kołodziej, Grzegorz

Abstract

<jats:title>Abstract</jats:title><jats:p>In this work we demonstrated the process of co-deposition of copper-tin sulfide species by the atomic layer deposition (ALD) technique using all-low-cost precursors. For the deposition of tin species, the tin(IV) chloride SnCl<jats:sub>4</jats:sub> was used successfully for the first time in the ALD process. Moreover, we showed that the successful deposition of the tin sulfide component was conditioned by the pre-deposition of CuS<jats:italic><jats:sub>x</jats:sub></jats:italic> layer. The co-deposition of copper and tin sulfides components at 150 °C resulted in the in-process formation of the film containing Cu<jats:sub>2</jats:sub>SnS<jats:sub>3</jats:sub>, Cu<jats:sub>3</jats:sub>SnS<jats:sub>4</jats:sub> and <jats:italic>π</jats:italic>-SnS phases. The process involving only tin precursor and H<jats:sub>2</jats:sub>S did not produce the SnS<jats:italic><jats:sub>x</jats:sub></jats:italic> species. The spectroscopic characteristic of the obtained materials were confronted with the literature survey, allowing us to discuss the methodology of the determination of ternary and quaternary sulfides purity by Raman spectroscopy. Moreover, the material characterisation with respect to the morphology (SEM), phase composition (XRD), surface chemical states (XPS), optical properties (UV–vis-NIR spectroscopy) and electric (Hall measurements) properties were provided. Finally, the obtained material was used for the formation of the p–n junction revealing the rectifying <jats:italic>I</jats:italic>–<jats:italic>V</jats:italic> characteristics.</jats:p>

Topics

• surface
• phase
• scanning electron microscopy
• x-ray diffraction
• thin film
• x-ray photoelectron spectroscopy
• copper
• tin
• Raman spectroscopy
• atomic layer deposition