Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2020Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As14citations
  • 2020Ambipolar transport in van der Waals black arsenic field effect transistors9citations
  • 2020Self-Assembled Periodic Nanostructures Using Martensitic Phase Transformations10citations
  • 2018Microstructure characterization of BaSnO3 thin films on LaAlO3 and PrScO3 substrates from transmission electron microscopy18citations
  • 2015Hybrid molecular beam epitaxy for the growth of stoichiometric BaSnO383citations

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Chart of shared publication
Koester, Steven J.
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Golani, Prafful
2 / 2 shared
Mkhoyan, K. Andre
4 / 17 shared
Wen, Jiaxuan
1 / 2 shared
Bucsek, Ashley
1 / 2 shared
Prakash, Abhinav
2 / 5 shared
Truttmann, Tristan K.
1 / 1 shared
Alù, Andrea
1 / 1 shared
Cotrufo, Michele
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Fali, Alireza
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Jalan, Bharat
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Kim, Jong Woo
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Ryan, Philip J.
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Abate, Yohannes
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Wang, Tianqi
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Mkhoyan, Andre
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Jeong, Jong Seok
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Postiglione, William
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Leighton, Chris
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2020
2018
2015

Co-Authors (by relevance)

  • Koester, Steven J.
  • Golani, Prafful
  • Mkhoyan, K. Andre
  • Wen, Jiaxuan
  • Bucsek, Ashley
  • Prakash, Abhinav
  • Truttmann, Tristan K.
  • Alù, Andrea
  • Cotrufo, Michele
  • Fali, Alireza
  • Jalan, Bharat
  • Kim, Jong Woo
  • Ryan, Philip J.
  • Abate, Yohannes
  • Wang, Tianqi
  • Mkhoyan, Andre
  • Jeong, Jong Seok
  • Postiglione, William
  • Leighton, Chris
OrganizationsLocationPeople

article

Ambipolar transport in van der Waals black arsenic field effect transistors

  • Koester, Steven J.
  • Wen, Jiaxuan
  • Golani, Prafful
  • Yun, Hwanhui
  • Mkhoyan, K. Andre
Abstract

<p>Black arsenic (BAs) is an elemental van der Waals semiconductor that is promising for a wide range of electronic and photonic applications. The narrow bandgap and symmetric band structure suggest that ambipolar (both n- and p-type) transport should be observable, however, only p-type transport has been experimentally studied to date. Here, we demonstrate and characterize ambipolar transport in exfoliated BAs field effect transistors. In the thickest flakes (∼ 80 nm), maximum currents, I max, up to 60 μA μm-1 and 90 μA μm-1are achieved for hole and electron conduction, respectively. Room-temperature hole (electron) mobilities up to 150 cm2 V-1 s-1 (175 cm2 V-1 s-1) were obtained, with temperature-dependence consistent with a phonon-scattering mechanism. The Schottky barrier height for Ni contacts to BAs was also extracted from the temperature-dependent measurements. I max for both n- and p-type conductivity was found to decrease with reduced thickness, while the ratio of I max to the minimum current, I min, increased. In the thinnest flakes (∼ 1.5 nm), only p-type conductivity was observed with the lowest value of I min = 400 fA μm-1. I max/I min ratios as high as 5 × 105 (5 × 102) were obtained, for p- (n-channel) devices. Finally, the ambipolarity was used to demonstrate a complementary logic inverter and a frequency doubling circuit.</p>

Topics
  • impedance spectroscopy
  • semiconductor
  • band structure
  • Arsenic