Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2018Metal oxide multilayer hard mask system for 3D nanofabrication8citations
  • 2017(Invited) Photo-Assisted ALD9citations
  • 2015Selective etching of focused gallium ion beam implanted regions from silicon as a nanofabrication method7citations
  • 2014Combining focused ion beam and atomic layer deposition in nanostructure fabrication6citations

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Salmi, Emma
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Leskelä, Markku Antero
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Ritala, Mikko
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Vehkamäki, Marko
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Miikkulainen, Ville
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Mizohata, Kenichiro
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Väyrynen, Katja
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Kilpi, Väinö
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Leskela, Markku
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Leskelä, Markku
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Co-Authors (by relevance)

  • Salmi, Emma
  • Leskelä, Markku Antero
  • Ritala, Mikko
  • Vehkamäki, Marko
  • Miikkulainen, Ville
  • Mizohata, Kenichiro
  • Räisänen, Jyrki
  • Väyrynen, Katja
  • Kilpi, Väinö
  • Mattinen, Miika
  • Leskela, Markku
  • Leskelä, Markku
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article

Metal oxide multilayer hard mask system for 3D nanofabrication

  • Salmi, Emma
  • Leskelä, Markku Antero
  • Ritala, Mikko
  • Han, Zhongmei
  • Vehkamäki, Marko
Abstract

We demonstrate the preparation and exploitation of multilayer metal oxide hard masks for lithography and 3D nanofabrication. Atomic layer deposition (ALD) and focused ion beam (FIB) technologies are applied for mask deposition and mask patterning, respectively. A combination of ALD and FIB was used and a patterning procedure was developed to avoid the ion beam defects commonly met when using FIB alone for microfabrication. ALD grown Al<sub>2</sub>O<sub>3</sub>/Ta<sub>2</sub>O<sub>5</sub>/Al<sub>2</sub>O<sub>3</sub> thin film stacks were FIB milled with 30 keV gallium ions and chemically etched in 5% tetramethylammonium hydroxide at 50 °C. With metal evaporation, multilayers consisting of amorphous oxides Al<sub>2</sub>O<sub>3</sub> and Ta<sub>2</sub>O<sub>5</sub> can be tailored for use in 2D lift-off processing, in preparation of embedded sub-100 nm metal lines and for multilevel electrical contacts. Good pattern transfer was achieved by lift-off process from the 2D hard mask for micro- and nano-scaled fabrication. As a demonstration of the applicability of this method to 3D structures, self-supporting 3D Ta<sub>2</sub>O<sub>5</sub> masks were made from a film stack on gold particles. Finally, thin film resistors were fabricated by utilizing controlled stiction of suspended Ta<sub>2</sub>O<sub>5</sub> structures.

Topics
  • amorphous
  • thin film
  • gold
  • focused ion beam
  • defect
  • evaporation
  • lithography
  • Gallium
  • atomic layer deposition