• Ager, Joel W., Iii
• Balasubramaniam, K. R.
• Maurya, Sandeep Kumar
• Das, Chandan
• Liu, Ya
• Xu, Xiaojie

Abstract

p-type transparent conducting Cu alloyed ZnS thin films from Cu<SUB>{x</SUB>} Zn<SUB>{1-x</SUB>} S targets (x = 0.1 , 0.2, 0.3, 0.4, and 0.5) were deposited on glass substrates via radio frequency sputtering. x-ray diffraction and TEM-SAED analysis show that all the films have sphalerite ZnS as the majority crystalline phase. In addition, films with 30% and 40% Cu show the presence of increasing amounts of crystalline Cu<SUB>2</SUB>S phase. Conductivity values  ⩾400 S cm<SUP>-1</SUP> were obtained for the films having 30% and 40% Cu, with the maximum conductivity of 752 S cm<SUP>-1</SUP> obtained for the film with 40% Cu. Temperature dependent electrical transport measurements indicate metallic as well as degenerate hole conductivity in the deposited films. The reflection-corrected transmittance of this Cu alloyed ZnS (40% Cu) film was determined to be  ⩾75% at 550 nm. The transparent conductor figure of merit (Φ<SUB>TC</SUB> ) of the Cu alloyed ZnS (40% Cu), calculated with the average value of transmittance between 1.5 to 2.5 eV, was  ≈276 μS ....

Topics

• x-ray diffraction
• thin film
• crystalline phase
• glass
• glass
• transmission electron microscopy