Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2015Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices5citations

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Chart of shared publication
Anjum, Dalaver H.
1 / 25 shared
Batra, Nitinkumar
1 / 2 shared
Deepak, Francis L.
1 / 1 shared
Costa, Pedro M. F. J.
1 / 8 shared
Chart of publication period
2015

Co-Authors (by relevance)

  • Anjum, Dalaver H.
  • Batra, Nitinkumar
  • Deepak, Francis L.
  • Costa, Pedro M. F. J.
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article

Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices

  • Anjum, Dalaver H.
  • Batra, Nitinkumar
  • Deepak, Francis L.
  • Costa, Pedro M. F. J.
  • Abdelkader, Ahmed
Abstract

The use of electron and ion beam deposition to make devices containing discrete nanostructures as interconnectors is a well-known nanofabrication process. Classically, one-dimensional materials such as carbon nanotubes (CNTs) have been electrically characterized by resorting to these beam deposition methods. While much attention has been given to the interconnectors, less is known about the contacting electrodes (or leads). In particular, the structure and chemistry of the electrode–interconnector interface is a topic that deserves more attention, as it is critical to understand the device behavior. Here, the structure and chemistry of Pt electrodes, deposited either with electron or ion beams and contacted to a CNT, are analyzed before and after thermally annealing the device in a vacuum. Free-standing Pt nanorods, acting as beam-deposited electrode models, are also characterized pre- and post-annealing. Overall, the as-deposited leads contain a non-negligible amount of amorphous carbon that is consolidated, upon heating, as a partially graphitized outer shell enveloping a Pt core. This observation raises pertinent questions regarding the definition of electrode–nanostructure interfaces in electrical devices, in particular long-standing assumptions of metal-CNT contacts fabricated by direct beam deposition methods.

Topics
  • impedance spectroscopy
  • amorphous
  • Carbon
  • nanotube
  • laser emission spectroscopy
  • annealing
  • one-dimensional
  • ion beam deposition