Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Instituto de Ciencia de Materiales de Sevilla

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2023Ti6Al4V coatings on titanium samples by sputtering techniques: Microstructural and mechanical characterization9citations
  • 2023Electropolymerized polypyrrole silver nanocomposite coatings on porous Ti substrates with enhanced corrosion and antibacterial behavior for biomedical applications29citations
  • 2020Low gas consumption fabrication of 3 He solid targets for nuclear reactions12citations
  • 2014On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles45citations
  • 2011Endurance of TiAlSiN coatings: Effect of Si and bias on wear and adhesion91citations

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Chart of shared publication
López-Santos, Carmen
1 / 9 shared
Rodríguez-Albelo, Marleny
1 / 1 shared
Torres, Yadir
1 / 18 shared
Sánchez-Pérez, Miriam
1 / 3 shared
Sánchez-López, J. C.
1 / 31 shared
García Cabezón, Ana Cristina
1 / 4 shared
Torres De La Sierra, Yuri
1 / 1 shared
Martín Pedrosa, Fernando
1 / 5 shared
Pérez González, Clara
1 / 1 shared
Hufschmidt, Dirk
1 / 4 shared
Lucas, Stéphane
2 / 33 shared
Feria, David
1 / 2 shared
Colaux, Julien L.
1 / 5 shared
Valiente-Dobón, Jose Javier
1 / 1 shared
Jiménez De Haro, Maria C.
1 / 1 shared
Fernández, Asunción
1 / 3 shared
Gadea, Andrés
1 / 2 shared
Caballero-Hernández, J.
1 / 4 shared
Moskovkin, Pavel
1 / 14 shared
Demarche, J.
1 / 3 shared
Fernández, A.
1 / 15 shared
Bera, B.
1 / 3 shared
Álvarez, R.
1 / 2 shared
Schierholz, R.
1 / 5 shared
Palmero, A.
1 / 4 shared
Philippon, David
1 / 7 shared
Delplancke-Ogletree, M. P.
1 / 4 shared
Fernandez, Arnaud
1 / 1 shared
Nagy, P. M.
1 / 3 shared
Chart of publication period
2023
2020
2014
2011

Co-Authors (by relevance)

  • López-Santos, Carmen
  • Rodríguez-Albelo, Marleny
  • Torres, Yadir
  • Sánchez-Pérez, Miriam
  • Sánchez-López, J. C.
  • García Cabezón, Ana Cristina
  • Torres De La Sierra, Yuri
  • Martín Pedrosa, Fernando
  • Pérez González, Clara
  • Hufschmidt, Dirk
  • Lucas, Stéphane
  • Feria, David
  • Colaux, Julien L.
  • Valiente-Dobón, Jose Javier
  • Jiménez De Haro, Maria C.
  • Fernández, Asunción
  • Gadea, Andrés
  • Caballero-Hernández, J.
  • Moskovkin, Pavel
  • Demarche, J.
  • Fernández, A.
  • Bera, B.
  • Álvarez, R.
  • Schierholz, R.
  • Palmero, A.
  • Philippon, David
  • Delplancke-Ogletree, M. P.
  • Fernandez, Arnaud
  • Nagy, P. M.
OrganizationsLocationPeople

article

On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles

  • Caballero-Hernández, J.
  • Moskovkin, Pavel
  • Demarche, J.
  • Godinho, Vanda
  • Lucas, Stéphane
  • Fernández, A.
  • Bera, B.
  • Álvarez, R.
  • Schierholz, R.
  • Palmero, A.
Abstract

The formation of the porous structure in dc magnetron sputtered amorphous silicon thin films at low temperatures is studied when using helium and/or argon as the processing gas. In each case, a-Si thin films were simultaneously grown at two different locations in the reactor which led to the assembly of different porous structures. The set of four fabricated samples has been analyzed at the microstructural level to elucidate the characteristics of the porous structure under the different deposition conditions. With the help of a growth model, we conclude that the chemical nature of the sputter gas not only affects the sputtering mechanism of Si atoms from the target and their subsequent transport in the gaseous/plasma phase towards the film, but also the pore formation mechanism and dynamics. When Ar is used, pores emerge as a direct result of the shadowing processes of Si atoms, in agreement with Thornton's structure zone model. The introduction of He produces, in addition to the shadowing effects, a new process where a degree of mobility results in the coarsening of small pores. Our results also highlight the influence of the composition of sputtering gas and tilt angles (for oblique angle deposition) on the formation of open and/or occluded porosity.

Topics
  • Deposition
  • porous
  • impedance spectroscopy
  • pore
  • amorphous
  • phase
  • mobility
  • thin film
  • simulation
  • Silicon
  • porosity