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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Kočí, Jan | Prague |
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| Azam, Siraj |
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| Azevedo, Nuno Monteiro |
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Jackson, Timothy
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Topics
Publications (12/12 displayed)
- 2015Influence of Uncertainty in Dielectric Properties on the Design Performance of a Tunable Composite Right/Left Handed Leaky Wave Antenna
- 2014Uncertainties in the permittivity of thin films extracted from measurements with near field microwave microscopy calibrated by an image charge modelcitations
- 2012Line defects, planar defects and voids in SrTiO3 films grown on MgO by pulsed laser and pulsed laser interval depositioncitations
- 2010Microstructural investigation of strontium titanate films grown by interval pulsed laser depositioncitations
- 2009Two-dimensional growth of SrTiO3 thin films on (001) MgO substrates using pulsed laser deposition and reflection high energy electron diffractioncitations
- 2009Comparison of structural, microstructural, and electrical analyses of barium strontium titanate thin filmscitations
- 2008Growth and Microstructural Studies of Strontium Titanate Films Grown by Standard and Interval Pulsed Laser Depositioncitations
- 2006Microstructure of Homeoepitaxial SrTiO₃ Thin Films Grown by Laser Ablationcitations
- 2006Temperature Dependent Dielectric Properties of Coplanar Phase Shifters Fabricated from Ba₀.₅SR₀.₅Ti0₃ Thin Filmscitations
- 2006Microwave and Microstructural Properties of Ba₀.₅Sr₀.₅TiO₃ of Thin Film Coplanar Phase Shifterscitations
- 2004Holes in YBa₂Cu₃0₇₋x Thin Films on Vicinal Strontium Titanate Substratescitations
- 2004Growth, Microwave Properties and Microstructure of Ba₀₊₀₅Sr₀₊₉₅TiO₃ Thin Filmscitations
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article
Uncertainties in the permittivity of thin films extracted from measurements with near field microwave microscopy calibrated by an image charge model
Abstract
The microwave microscope is a device which utilises near fields to characterise material properties of samples on length scales smaller than the operating wavelength. The errors associated with extracting the permittivity of a high permittivity thin film on a low permittivity substrate from measurements using such a device are found to be of the order of 25 % when using a widely used image charge model of the tip-sample interaction. The uncertainties arise from the model-based extraction of the permittivity from the raw frequency shift data, and in the current case are shown to come from the assumption in the model that the tip of the microwave probe can be modelled as a sphere.<br/>The raw data from the microscope contain random uncertainties of the order of 1 % and reveal variations in the properties of the thin film with sub-wavelength resolution demonstrating the microwave microscope as a sub-wavelength characterisation technique for thin films. <br/>