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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Li, Ning
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (16/16 displayed)
- 2023Matching the photocurrent of 2‐terminal mechanically‐stacked perovskite/organic tandem solar modules by varying the cell widthcitations
- 2022Comparison of the sputtered TiO2 anatase and rutile thin films as electron transporting layers in perovskite solar cellscitations
- 2022Ligand Tuning of Localized Surface Plasmon Resonances in Antimony-Doped Tin Oxide Nanocrystalscitations
- 2021Comparison of the sputtered TiO2 anatase and rutile thin films as electron transporting layers in perovskite solar cellscitations
- 2021Interface Molecular engineering for laminated monolithic perovskite/silicon tandem solar cells with 80.4% fill factorcitations
- 2021Dislocation-toughened ceramicscitations
- 2021Understanding the Microstructure Formation of Polymer Films by Spontaneous Solution Spreading Coating with a High‐Throughput Engineering Platformcitations
- 2020Derivation and Application of a Tool to Estimate Benefits From Multiple Therapies That Reduce Recurrent Stroke Riskcitations
- 2019Favorable Mixing Thermodynamics in Ternary Polymer Blends for Realizing High Efficiency Plastic Solar Cellscitations
- 2014Towards large-scale production of solution-processed organic tandem modules based on ternary composites: Design of the intermediate layer, device optimization and laser based module processingcitations
- 2013ITO-free and fully solution-processed semitransparent organic solar cells with high fill factorscitations
- 2013Overcoming interface losses in organic solar cells by applying low temperature, solution processed aluminum-doped zinc oxide electron extraction layerscitations
- 2013An efficient solution-processed intermediate layer for facilitating fabrication of organic multi-junction solar cellscitations
- 2009Open circuit voltage enhancement due to reduced dark current in small molecule photovoltaic cellscitations
- 2006Metrology in a scanning electron microscope: theoretical developments and experimental validationcitations
- 2002Enhancement of aluminum oxide physical vapor deposition with a secondary plasmacitations
Places of action
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article
Metrology in a scanning electron microscope: theoretical developments and experimental validation
Abstract
International audience ; A novel approach for correcting both spatial and drift distortions that are present in scanning electron microscope (SEM) images is described. Spatial distortion removal is performed using a methodology that employs a series of in-plane rigid body motions and a generated warping function. Drift distortion removal is performed using multiple, time-spaced images to extract the time-varying relative displacement field throughout the experiment. Results from numerical simulations clearly demonstrate that the correction procedures successfully remove both spatial and drift distortions. Specifically, in the absence of intensity noise the distortion removal methods consistently give excellent results with errors on the order of +/- 0.01 pixels. Results from the rigid body motion and tensile loading experiments at 200 x indicate that, after correction for distortions, (a) the displacements have nearly random variability with a standard deviation of 0.02 pixels; (b) the measured strain fields are unbiased and in excellent agreement with previous full-field experimental data obtained with optical illumination; (c) the strain field variability is on the order of 60 microstrain in all components with a spatial resolution on the order of 25 pixels. Taken together, the analytical, computational and experimental studies clearly show that the correction procedures successfully remove both spatial and drift distortions while retaining excellent spatial resolution, confirming that the SEM-based method can be used for both micromaterial and nanomaterial characterization in either the elastic or elastic-plastic deformation regimes.