Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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PeopleLocationsStatistics
Naji, M.
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Li, Xiaodong

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2024Unveiling fracture mechanics of a curved coating/substrate system by combined digital image correlation and numerical finite element analyses1citations
  • 2023Evaluation of air oxidation and internal stresses induced by quenching of partially Cr-coated and uncoated optimized ZIRLO part I:Materials characterization2citations
  • 2022On the thermal and mechanical properties of Mg0.2Co0.2Ni0.2Cu0.2Zn0.2O across the high-entropy to entropy-stabilized transition17citations
  • 2020Unveiling hermetic failure of ceramic tubes by digital image correlation and acoustic emission19citations
  • 2015Soft chemical control of superconductivity in Lithium Iron Selenide Hydroxides Li1–xFex(OH)Fe1–ySe115citations
  • 2015Soft Chemical Control of Superconductivity in Lithium Iron Selenide Hydroxides Li(_{1–x})Fe(_x)(OH)Fe(_{1–y})Se115citations
  • 2006Metrology in a scanning electron microscope: theoretical developments and experimental validation137citations

Places of action

Chart of shared publication
Lahoda, Edward
1 / 1 shared
Walters, Jorie L.
2 / 2 shared
Bumgardner, Clifton H.
3 / 4 shared
Burden, Diana
1 / 1 shared
Maier, Ben
1 / 1 shared
Harrell, Timothy M.
1 / 8 shared
Roache, David C.
2 / 2 shared
Roache, David Charles
1 / 1 shared
Love-Baker, Cole Alexander
1 / 1 shared
Harrell, Timothy Michael
1 / 1 shared
Maier, Benjamin R.
1 / 1 shared
Hudyncia, Hans William
1 / 1 shared
Lahoda, Edward J.
2 / 2 shared
Burden, Diana Elizabeth
1 / 1 shared
Hoque, Md Shafkat Bin
1 / 2 shared
Schmuckler, Daniel
1 / 1 shared
Maria, Jon-Paul
1 / 3 shared
Hopkins, Patrick
1 / 2 shared
Rost, Christina
1 / 1 shared
Gaskins, John T.
1 / 3 shared
Lu, Roger
1 / 1 shared
Deck, Christian P.
1 / 4 shared
Heim, Frederick
1 / 2 shared
Xu, Peng
1 / 5 shared
Jarama, Alex
1 / 2 shared
Cartenet, Simon
2 / 2 shared
Williams, Benjamin H.
2 / 2 shared
Ramos, Silvia
2 / 6 shared
Clarke, Simon J.
2 / 7 shared
Mary, Nicolas
2 / 19 shared
Blundell, Stephen J.
2 / 5 shared
Foronda, Francesca R.
2 / 2 shared
Woodruff, Daniel N.
2 / 4 shared
Thompson, Amber L.
2 / 5 shared
Forder, Sue
1 / 5 shared
Sedlmaier, Stefan J.
2 / 6 shared
Cassidy, Simon J.
2 / 6 shared
Sun, Hualei
2 / 2 shared
Allcroft, Genevieve M.
2 / 2 shared
Bingham, Paul
1 / 29 shared
Bingham, Paul A.
1 / 7 shared
Forder, Susan D.
1 / 1 shared
Orteu, Jean-José
1 / 13 shared
Garcia, Dorian
1 / 2 shared
Mcneill, Stephen R.
1 / 1 shared
Li, Ning
1 / 16 shared
Schreier, Hubert W.
1 / 1 shared
Cornille, Nicolas
1 / 1 shared
Sutton, Michael A.
1 / 2 shared
Chart of publication period
2024
2023
2022
2020
2015
2006

Co-Authors (by relevance)

  • Lahoda, Edward
  • Walters, Jorie L.
  • Bumgardner, Clifton H.
  • Burden, Diana
  • Maier, Ben
  • Harrell, Timothy M.
  • Roache, David C.
  • Roache, David Charles
  • Love-Baker, Cole Alexander
  • Harrell, Timothy Michael
  • Maier, Benjamin R.
  • Hudyncia, Hans William
  • Lahoda, Edward J.
  • Burden, Diana Elizabeth
  • Hoque, Md Shafkat Bin
  • Schmuckler, Daniel
  • Maria, Jon-Paul
  • Hopkins, Patrick
  • Rost, Christina
  • Gaskins, John T.
  • Lu, Roger
  • Deck, Christian P.
  • Heim, Frederick
  • Xu, Peng
  • Jarama, Alex
  • Cartenet, Simon
  • Williams, Benjamin H.
  • Ramos, Silvia
  • Clarke, Simon J.
  • Mary, Nicolas
  • Blundell, Stephen J.
  • Foronda, Francesca R.
  • Woodruff, Daniel N.
  • Thompson, Amber L.
  • Forder, Sue
  • Sedlmaier, Stefan J.
  • Cassidy, Simon J.
  • Sun, Hualei
  • Allcroft, Genevieve M.
  • Bingham, Paul
  • Bingham, Paul A.
  • Forder, Susan D.
  • Orteu, Jean-José
  • Garcia, Dorian
  • Mcneill, Stephen R.
  • Li, Ning
  • Schreier, Hubert W.
  • Cornille, Nicolas
  • Sutton, Michael A.
OrganizationsLocationPeople

article

Metrology in a scanning electron microscope: theoretical developments and experimental validation

  • Orteu, Jean-José
  • Garcia, Dorian
  • Li, Xiaodong
  • Mcneill, Stephen R.
  • Li, Ning
  • Schreier, Hubert W.
  • Cornille, Nicolas
  • Sutton, Michael A.
Abstract

International audience ; A novel approach for correcting both spatial and drift distortions that are present in scanning electron microscope (SEM) images is described. Spatial distortion removal is performed using a methodology that employs a series of in-plane rigid body motions and a generated warping function. Drift distortion removal is performed using multiple, time-spaced images to extract the time-varying relative displacement field throughout the experiment. Results from numerical simulations clearly demonstrate that the correction procedures successfully remove both spatial and drift distortions. Specifically, in the absence of intensity noise the distortion removal methods consistently give excellent results with errors on the order of +/- 0.01 pixels. Results from the rigid body motion and tensile loading experiments at 200 x indicate that, after correction for distortions, (a) the displacements have nearly random variability with a standard deviation of 0.02 pixels; (b) the measured strain fields are unbiased and in excellent agreement with previous full-field experimental data obtained with optical illumination; (c) the strain field variability is on the order of 60 microstrain in all components with a spatial resolution on the order of 25 pixels. Taken together, the analytical, computational and experimental studies clearly show that the correction procedures successfully remove both spatial and drift distortions while retaining excellent spatial resolution, confirming that the SEM-based method can be used for both micromaterial and nanomaterial characterization in either the elastic or elastic-plastic deformation regimes.

Topics
  • impedance spectroscopy
  • polymer
  • scanning electron microscopy
  • experiment
  • simulation
  • random