| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Mazierska, Janina
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2021Complex Permittivity of Mixtures of Sand With Aqueous NaCl Solutions Measured at 2.5 GHzcitations
- 2011Microwave and RF methods of contactless mapping of the sheet resistance and the complex permittivity of conductive materials and semiconductorscitations
- 2006Temperature dependence of complex permittivity of planar microwave materialscitations
- 2006Measurements of conductivity of thin gold films at microwave frequencies employing resonant techniquescitations
- 2005Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 Kcitations
- 2005Precise microwave characterisation of low loss dielectrics
- 2004A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuitscitations
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Microwave characterization of (La,Sr)(AlTa)O3 using TE011 mode dielectric resonator
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequenciescitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
Places of action
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article
Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonator
Abstract
Accurate data of complex permittivity of dielectric substrates are needed for efficient design of HTS microwave planar circuits. We have tested MgO substrates from three different manufacturing batches using a dielectric resonator with superconducting parts recently developed for precise microwave characterization of laminar dielectrics at cryogenic temperatures. The measurement fixture has been fabricated using a SrLaAlO3 post dielectric resonator with DyBa2Cu3O7 end plates and silver-plated copper sidewalls to achieve the resolution of loss tangent measurements of 2 × 10−6. The tested MgO substrates exhibited the average relative permittivity of 9.63 and tanδ from 3.7 × 10−7 to 2 × 10−5 at frequency of 10.5 GHz in the temperature range from 14 to 80 K.