Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2016Optical, morphological properties and surface energy of the transparent Li<sub>4</sub>Ti<sub>5</sub>O<sub>12</sub> (LTO) thin film as anode material for secondary type batteries27citations
  • 2016Optical and surface properties of optically transparent Li<sub>3</sub>PO<sub>4</sub> solid electrolyte layer for transparent solid batteries11citations

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Özen, Soner
2 / 2 shared
Pat, Suat
2 / 3 shared
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2016

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  • Özen, Soner
  • Pat, Suat
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article

Optical, morphological properties and surface energy of the transparent Li<sub>4</sub>Ti<sub>5</sub>O<sub>12</sub> (LTO) thin film as anode material for secondary type batteries

  • Özen, Soner
  • Korkmaz, Şadan
  • Pat, Suat
Abstract

<jats:title>Abstract</jats:title><jats:p>LTO thin film was deposited for the first time on a glass microscope slide (MS) by RF magnetron sputtering technology. This method has been suitable for preparation of high-quality thin films. The surface properties of the produced film were determined by atomic force microscope (AFM). The surface of the produced film appeared smooth and homogeneous. LTO coated on MS had compact structure and low roughness. A UV–vis spectrophotometer was used to determine intensity of light passing through the samples. Thus, according to the results obtained the produced film was highly transparent. The refractive index of the LTO thin film was presented in a low MSE value by spectroscopic ellipsometry (SE) and it was about 1.5. The optical band gap (<jats:italic>E</jats:italic><jats:sub>g</jats:sub>) was determined by the Tauc method. The produced LTO thin film exhibited a wide band gap semiconductor property with a band gap energy of about 2.95 eV. Finally, the surface free energy of the LTO thin film was calculated from the contact angle measurements using the Lewis acid-base, OWRK/Fowkes, Wu and Zisman methods.</jats:p>

Topics
  • surface
  • thin film
  • atomic force microscopy
  • glass
  • semiconductor
  • glass
  • mass spectrometry
  • ellipsometry
  • surface energy