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Motta, Antonella |
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Petrov, R. H. | Madrid |
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Ager, J. W.
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Topics
Publications (11/11 displayed)
- 2013P-type and undoped InGaN across the entire alloy composition range
- 2013P-type InGaN across the entire alloy composition rangecitations
- 2012Embedded binary eutectic alloy nanostructurescitations
- 2009Properties of native point defects in In1-xAlxN alloyscitations
- 2008Characterization of MG-doped InGaN and InALN alloys grown by MBE for solar applicationscitations
- 2008Band gap bowing parameter of In1-x Alx Ncitations
- 2008High efficiency InAlN-based solar cellscitations
- 2008Low-temperature grown compositionally graded InGaN filmscitations
- 2002Band anticrossing in highly mismatched group II-VI semiconductor alloys
- 2002Band anticrossing effects in MgyZn1-yTe 1-xSex alloyscitations
- 2000Synthesis of III-Nx-V1-x Thin Films by N Ion Implantationcitations
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article
Properties of native point defects in In1-xAlxN alloys
Abstract
The electrical and optical properties of the In-rich InAlN alloys are strongly influenced by native point defects. Here the effects of the defects are studied using 2 MeV He<sup>+</sup> irradiation to vary the defect concentration. Localized native defects in In<sub>1-x</sub>Al<sub>x</sub>N(x <0.45) are predominantly donors, with energy levels located above the conduction band edge. Accordingly, the electron concentration increases and the optical absorption edge blue shifts with increasing irradiation fluence before saturating at high fluences. Saturation occurs when the Fermi level reaches the Fermi level stabilization energy, which is the average energy of localized native defects in semiconductors, at 4.9 eV below the vacuum level. The energy position of the native defects also explains the initial increase followed by the quenching of the photoluminescence (PL) intensity, as well as the blue shift in the PL peak, with increasing irradiation fluence. © 2009 IOP Publishing Ltd.