Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Li, S. X.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2009Properties of native point defects in In1-xAlxN alloys3citations
  • 2006Multiband GaNAsP quaternary alloys130citations
  • 2006Structure and electronic properties of InN and In-rich group III-nitride alloys237citations
  • 2004Group III-nitride alloys as photovoltaic materials10citations
  • 2003Band-gap bowing effects in BxGa1-xAs alloys39citations

Places of action

Chart of shared publication
Lu, H.
1 / 15 shared
Walukiewicz, W.
5 / 87 shared
Jones, R. E.
3 / 8 shared
Haller, E. E.
4 / 30 shared
Schaff, W. J.
1 / 10 shared
Ager, J. W.
1 / 11 shared
Sharp, I. D.
1 / 6 shared
Dubon, O. D.
1 / 40 shared
Iii, J. W. Ager
3 / 18 shared
Bour, D.
1 / 1 shared
Farshchi, R.
1 / 6 shared
Denlinger, J. D.
1 / 5 shared
Liliental-Weber, Z.
1 / 25 shared
Wu, J.
3 / 56 shared
Jr., J. W. Ager
1 / 1 shared
Lu, Hai
1 / 5 shared
Schaff, William J.
1 / 5 shared
Kurtz, Sarah R.
1 / 3 shared
Friedman, D. J.
1 / 6 shared
Qeisz, J. F.
1 / 1 shared
Shan, W.
1 / 16 shared
Chart of publication period
2009
2006
2004
2003

Co-Authors (by relevance)

  • Lu, H.
  • Walukiewicz, W.
  • Jones, R. E.
  • Haller, E. E.
  • Schaff, W. J.
  • Ager, J. W.
  • Sharp, I. D.
  • Dubon, O. D.
  • Iii, J. W. Ager
  • Bour, D.
  • Farshchi, R.
  • Denlinger, J. D.
  • Liliental-Weber, Z.
  • Wu, J.
  • Jr., J. W. Ager
  • Lu, Hai
  • Schaff, William J.
  • Kurtz, Sarah R.
  • Friedman, D. J.
  • Qeisz, J. F.
  • Shan, W.
OrganizationsLocationPeople

document

Structure and electronic properties of InN and In-rich group III-nitride alloys

  • Denlinger, J. D.
  • Liliental-Weber, Z.
  • Walukiewicz, W.
  • Jones, R. E.
  • Wu, J.
  • Li, S. X.
  • Jr., J. W. Ager
Abstract

The experimental study of InN and In-rich InGaN by a number of structural, optical and electrical methods is reviewed. Recent advances in thin film growth have produced single crystal epitaxial layers of InN which are similar in structural quality to GaN films made under similar conditions and which can have electron concentrations below 1 × 10<sup>18</sup> cm<sup>-3</sup> and mobilities exceeding 2000 cm<sup>2</sup> (Vs)<sup>-1</sup>. Optical absorption, photoluminescence, photo-modulated reflectance and soft x-ray spectroscopy measurements were used to establish that the room temperature band gap of InN is 0.67 ± 0.05 eV. Experimental measurements of the electron effective mass in InN are presented and interpreted in terms of a non-parabolic conduction band caused by the k · p interaction across the narrow gap. Energetic particle irradiation is shown to be an effective method to control the electron concentration, n, in undoped InN. Optical studies of irradiated InN reveal a large Burstein-Moss shift of the absorption edge with increasing n. Fundamental studies of the energy levels of defects in InN and of electron transport are also reviewed. Finally, the current experimental evidence for p-type activity in Mg-doped InN is evaluated. © 2006 IOP Publishing Ltd.

Topics
  • impedance spectroscopy
  • photoluminescence
  • single crystal
  • thin film
  • nitride
  • defect
  • X-ray spectroscopy