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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Rajagopalan, Jagannathan
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (4/4 displayed)
- 2019Electron beam induced rejuvenation in a metallic glass film during in-situ TEM tensile strainingcitations
- 2017Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffractioncitations
- 2015Electron beam induced artifacts during in situ TEM deformation of nanostructured metalscitations
- 2010In situ TEM study of microplasticity and Bauschinger effect in nanocrystalline metalscitations
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article
Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction
Abstract
We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealed<br/>significant anelastic deformation, which was independently confirmed by strain rate experiments. Furthermore, the distribution of first nearest-neighbor distances became narrower during loading and permanent changes were observed in the atomic structure upon unloading, even in the absence of macroscopic plasticity. The results demonstrate the capability of in situ electron diffraction to probe structural rearrangements and decouple elastic and anelastic deformation in metallic glasses.