Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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University of Huddersfield

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2020Demanding applications in harsh environment–FeCrMnNiC amorphous equiatomic alloy thin film8citations

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Muftah, Waleed
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Vishnyakov, Vm
1 / 30 shared
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2020

Co-Authors (by relevance)

  • Muftah, Waleed
  • Vishnyakov, Vm
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article

Demanding applications in harsh environment–FeCrMnNiC amorphous equiatomic alloy thin film

  • Muftah, Waleed
  • Vishnyakov, Vm
  • Patmore, Nathan
Abstract

<p>An amorphous equiatomic FeCrMnNiC alloy thin film was synthesised on silica and silicon substrates by ion beam sputter deposition. Scanning electron microscopy energy-dispersive X-ray spectroscopy, X-ray diffraction, selected area electron diffraction and nano indentation were used to investigate the material. The produced film is amorphous and uniform on the atomic level without any detectable element segregation. The corrosion properties were assessed in 3.5% NaCl solution. The FeCrMnNiC alloy has corrosion resistance better than corrosion resistance of 304 SS. The thin film has hardness at around 12.3 ± 0.5 GPa and reduced Young’s modulus at around 222 ± 12 GPa.</p>

Topics
  • Deposition
  • impedance spectroscopy
  • amorphous
  • corrosion
  • scanning electron microscopy
  • x-ray diffraction
  • thin film
  • electron diffraction
  • hardness
  • Silicon
  • Energy-dispersive X-ray spectroscopy