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Suherman, P. M.
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Publications (3/3 displayed)
- 2009Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of BaSr TiO thin films
- 2008Effect of growth defects on microwave properties in epitaxial Ba0.5Sr0.5TiO3 thin films grown on (001) MgO by pulsed laser depositioncitations
- 2008BaxSr1 - xTiO3 Thin Films for Tunable Microwave Devices in Cryogenic and Room Temperature Applicationcitations
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article
BaxSr1 - xTiO3 Thin Films for Tunable Microwave Devices in Cryogenic and Room Temperature Application
Abstract
The microwave properties of YBCO/Ba0.05Sr0.95TiO3 (BST5) and Ag/Ba0.5Sr0.5TiO3 (BST50) films were characterized at 80 K and 290 K. At zero bias, the BST5 had a permittivity of 400 and a loss tangent of 0.02; the BST50 had a permittivity of 900 and a loss tangent of 0.1. The respective tunabilities at 3.6 V m- 1 were 15% and 44%. Analysis of the performance of phase shifters and tunable filters based on these films showed that both conductor and dielectric losses need to be considered in the selection of materials for devices. A high tunability alone does not guarantee good performance.