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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Tse, Yau
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (9/9 displayed)
- 2012Line defects, planar defects and voids in SrTiO3 films grown on MgO by pulsed laser and pulsed laser interval depositioncitations
- 2010Microstructural investigation of strontium titanate films grown by interval pulsed laser depositioncitations
- 2009Two-dimensional growth of SrTiO3 thin films on (001) MgO substrates using pulsed laser deposition and reflection high energy electron diffractioncitations
- 2009Comparison of structural, microstructural, and electrical analyses of barium strontium titanate thin filmscitations
- 2008Growth and Microstructural Studies of Strontium Titanate Films Grown by Standard and Interval Pulsed Laser Depositioncitations
- 2007Microstructural study of a YBCO multilayer coated conductor cylindercitations
- 2006Microstructure of Homeoepitaxial SrTiO₃ Thin Films Grown by Laser Ablationcitations
- 2006Temperature Dependent Dielectric Properties of Coplanar Phase Shifters Fabricated from Ba₀.₅SR₀.₅Ti0₃ Thin Filmscitations
- 2006Microwave and Microstructural Properties of Ba₀.₅Sr₀.₅TiO₃ of Thin Film Coplanar Phase Shifterscitations
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article
Growth and Microstructural Studies of Strontium Titanate Films Grown by Standard and Interval Pulsed Laser Deposition
Abstract
Strontium titanate films were grown by standard and interval pulsed laser interval deposition on (001) strontium titanate and magnesium oxide substrates. Reflection high-energy electron diffraction (RHEED) was used to monitor the growth mode of the films. The microstructures were investigated using transmission electron microscopy. The temporal evolution of the RHEED intensity confirmed a layer-by-layer growth mode in the homoepitaxial case. In heteroepitaxy, three dimensional growth occurred. Misfit dislocations and threading dislocations were the dominant defects. The film grown using the standard deposition was relaxed; the film grown using interval deposition was under in-plane tension and showed fewer threading dislocations.