Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2014Uncertainties in the permittivity of thin films extracted from measurements with near field microwave microscopy calibrated by an image charge model5citations
  • 2006Temperature Dependent Dielectric Properties of Coplanar Phase Shifters Fabricated from Ba₀.₅SR₀.₅Ti0₃ Thin Films5citations
  • 2006Microwave and Microstructural Properties of Ba₀.₅Sr₀.₅TiO₃ of Thin Film Coplanar Phase Shifters53citations

Places of action

Chart of shared publication
Jackson, Timothy
3 / 12 shared
Barker, Duncan
1 / 1 shared
Lancaster, Mj
3 / 24 shared
Gashinova, Marina
1 / 3 shared
Tse, Yau
2 / 9 shared
Chakalova, Radka
1 / 3 shared
Jones, Ian
1 / 58 shared
Porch, A.
1 / 4 shared
Chart of publication period
2014
2006

Co-Authors (by relevance)

  • Jackson, Timothy
  • Barker, Duncan
  • Lancaster, Mj
  • Gashinova, Marina
  • Tse, Yau
  • Chakalova, Radka
  • Jones, Ian
  • Porch, A.
OrganizationsLocationPeople

article

Temperature Dependent Dielectric Properties of Coplanar Phase Shifters Fabricated from Ba₀.₅SR₀.₅Ti0₃ Thin Films

  • Suherman, Phe
  • Jackson, Timothy
  • Tse, Yau
  • Lancaster, Mj
Abstract

This paper presents an analysis of the temperature dependent properties and performance of coplanar waveguide transmission lines on Ba0.5Sr0.5TiO3 (BST) thin films. Comparison of the temperature dependent permittivity at microwave frequencies with models of heterogeneous ferroelectrics reveals significant physical properties, such as the Curie temperature, Curie-Weiss constant, and statistical defects in the films. The maximum phase shift and tunability are obtained at the temperature where the permittivity is highest.

Topics
  • impedance spectroscopy
  • phase
  • thin film
  • defect
  • Curie temperature