Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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693.932 PEOPLE
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2024(invited talk) Sulfur-hyperdoped silicon by ultrashort laser processingcitations
  • 2024Impact of post-ion implantation annealing on Se-hyperdoped Ge1citations
  • 2023(oral talk) Effective carrier lifetime in ultrashort pulse laser hyperdoped silicon: dopant concentration dependence and practical upper limitscitations

Places of action

Chart of shared publication
Seibt, Michael
1 / 14 shared
Savin, Hele
3 / 75 shared
Radfar, Behrad
3 / 9 shared
Paulus, Simon
2 / 3 shared
Liu, Xiaolong
3 / 13 shared
Niemeyer, Tobias
1 / 1 shared
Schäfer, Sören
3 / 6 shared
Koskinen, Vesa
1 / 1 shared
Vähänissi, Ville
3 / 43 shared
Kontermann, Stefan
3 / 8 shared
Mutschall, Doris
1 / 2 shared
Serue, Michael
1 / 2 shared
Berencen, Yonder
1 / 4 shared
Kentsch, Ulrich
1 / 7 shared
Zhou, Shengqiang
1 / 15 shared
Chart of publication period
2024
2023

Co-Authors (by relevance)

  • Seibt, Michael
  • Savin, Hele
  • Radfar, Behrad
  • Paulus, Simon
  • Liu, Xiaolong
  • Niemeyer, Tobias
  • Schäfer, Sören
  • Koskinen, Vesa
  • Vähänissi, Ville
  • Kontermann, Stefan
  • Mutschall, Doris
  • Serue, Michael
  • Berencen, Yonder
  • Kentsch, Ulrich
  • Zhou, Shengqiang
OrganizationsLocationPeople

article

Impact of post-ion implantation annealing on Se-hyperdoped Ge

  • Liu, Xiaolong
  • Schäfer, Sören
  • Berencen, Yonder
  • Vähänissi, Ville
  • Savin, Hele
  • Kontermann, Stefan
  • Radfar, Behrad
  • Kentsch, Ulrich
  • Kearney, Patrick Mc
  • Zhou, Shengqiang
Abstract

Hyperdoped germanium (Ge) has demonstrated increased sub-bandgap absorption, offering potential applications in the short-wavelength-infrared spectrum (1.0-3.0 μm). This study employs ion implantation to introduce a high concentration of selenium (Se) into Ge and investigates the effects of post-implantation annealing techniques on the recovery of implantation damage and alterations in optical properties. We identify optimal conditions for two distinct annealing techniques: rapid thermal annealing (RTA) at a temperature of 650 °C and ultrafast laser heating (ULH) at a fluence of 6 mJ/cm2. The optimized ULH process outperforms the RTA method in preserving high doping profiles and achieving a fourfold increase in sub-bandgap absorption. However, RTA leads to regrowth of single crystalline Ge, while ULH most likely leads to polycrystalline Ge. The study offers valuable insights into the hyperdoping processes in Ge for the development of advanced optoelectronic devices. © 2024 Author(s).

Topics
  • annealing
  • Germanium