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Karwal, S.
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Publications (6/6 displayed)
- 2024Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy
- 2018Tailoring nanopore formation in atomic layer deposited ultrathin filmscitations
- 2018Tuning Material Properties of Oxides and Nitrides by Substrate Biasing during Plasma-Enhanced Atomic Layer Deposition on Planar and 3D Substrate Topographiescitations
- 2018Low-temperature plasma-enhanced atomic layer deposition of 2-D MoS 2 :Large area, thickness control and tuneable morphologycitations
- 2018Low resistivity HfN : X grown by plasma-assisted ALD with external rf substrate biasingcitations
- 2017Plasma-assisted atomic layer deposition of HfNx: tailoring the film properties by the plasma gas compositioncitations
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article
Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy
Abstract
<jats:p>Magnetic nanometric skyrmions are small complex vortex-like topological defects, mainly found in non-centrosymmetric crystals such as MnSi. They have potential applications for future spintronic devices. In this article, the structural, electronic, and magnetic states of the Mn atoms in a polycrystalline MnSi thin film facing a c-sapphire substrate were studied using x-ray diffraction, x-ray photo-emission spectroscopy, resonance photoemission spectroscopy (RPES), and extended x-ray absorption fine structure (EXAFS). The valence band spectra indicate the metallic nature of the film. The RPES study reveals the presence of major itinerant Mn 3d states near EF and also the mixed Mn 3d and Si 3s–3p states from 5.3 to 11.3 eV. The EXAFS spectrum does not show the existence of oxygen vacancies in the system, and the obtained magnetic moment in the non-stoichiometric MnSi thin film is a combination of the partially itinerant and partially localized Mn 3d states.</jats:p>