Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2024Growth optimization, optical, and dielectric properties of heteroepitaxially grown ultrawide-bandgap ZnGa2O4 (111) thin film9citations

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Halim, Md Abdul
1 / 1 shared
Droopad, Ravi
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Tasnim, Ayesha
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Shiam, Istiaq Firoz
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Sarkar, Pallab Kumar
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Karmakar, Subrata
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Sultana, Maria
1 / 1 shared
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2024

Co-Authors (by relevance)

  • Halim, Md Abdul
  • Droopad, Ravi
  • Tasnim, Ayesha
  • Shiam, Istiaq Firoz
  • Sarkar, Pallab Kumar
  • Karmakar, Subrata
  • Sultana, Maria
OrganizationsLocationPeople

article

Growth optimization, optical, and dielectric properties of heteroepitaxially grown ultrawide-bandgap ZnGa2O4 (111) thin film

  • Emu, Injamamul Hoque
  • Halim, Md Abdul
  • Droopad, Ravi
  • Tasnim, Ayesha
  • Shiam, Istiaq Firoz
  • Sarkar, Pallab Kumar
  • Karmakar, Subrata
  • Sultana, Maria
Abstract

<jats:p>Ultrawide bandgap ZnGa2O4 (ZGO) thin films were grown on sapphire (0001) substrates at various growth temperatures with a perspective to investigate the electrical and optical characteristics required for high-power electronic applications. Due to the variation in the vapor pressure of Zn and Ga, severe loss of Zn was observed during pulsed laser deposition, which was solved by using a zinc-rich Zn0.98Ga0.02O target. A pure phase single-crystalline ZGO thin film was obtained at a deposition temperature of 750 °C and an oxygen pressure of 1 × 10−2 Torr. The out-of-plane epitaxial relationship between the sapphire and ZGO thin film was obtained from φ-scan. The x-ray rocking curve of the ZGO thin film grown at 750 °C exhibits a full width at half maximum of ∼0.098°, which indicates a good crystalline phase and quality of the thin film. Core-level x-ray photoelectron spectroscopy of ZGO grown at 750 °C indicated that Zn and Ga were in the 2+ and 3+ oxidation states, respectively, and the atomic ratio of Zn/Ga was estimated to be ∼0.48 from the fitted values of Zn-2p3/2 and Ga-2p3/2. The high-resolution transmission electron microscopy images revealed a sharp interface with the thickness of the ZGO film of ∼265 nm, and the signature of minor secondary phases was observed. The bandgap of the ZGO film at different growth temperatures was calculated from the ultraviolet-diffuse reflectance spectroscopy spectra, and its value was obtained to be ∼5.08 eV for the 750 °C grown sample. The refractive index (n) and the extinction coefficient (k) were determined to be ∼1.94 and 0.023 from the ellipsometric data, respectively, and the real dielectric function (ɛr) was estimated to be ∼6.8 at energy 5 eV. The ultrawide bandgap and dielectric function of ZGO recommend its possible potential applications in deep-ultraviolet optoelectronic devices and high-power electronics.</jats:p>

Topics
  • thin film
  • x-ray photoelectron spectroscopy
  • Oxygen
  • crystalline phase
  • zinc
  • transmission electron microscopy
  • pulsed laser deposition