• Arbogast, Augustus
• Goldman, Rachel
• Ozdemir, Erdem
• Naab, Fabian
• Wasserman, Daniel
• Borrely, Thales
• Anderson, Jonathan
• Dey, Tuhin
• Cooper, Joshua

Abstract

<jats:p>GeSnC alloys offer a route to direct bandgap semiconductors for CMOS-compatible lasers, but the use of CBr4 as a carbon source was shown to reduce Sn incorporation by 83%–92%. We report on the role of thermally cracked H in increasing Sn incorporation by 6x–9.5x, restoring up to 71% of the lost Sn, and attribute this increase to removal of Br from the growth surface as HBr prior to formation of volatile groups such as SnBr4. Furthermore, as the H flux is increased, Rutherford backscattering spectroscopy reveals a monotonic increase in both Sn and carbon incorporation. X-ray diffraction reveals tensile-strained films that are pseudomorphic with the substrate. Raman spectroscopy suggests substitutional C incorporation; both x-ray photoelectron spectroscopy and Raman suggest a lack of graphitic carbon or its other phases. For the lowest growth temperatures, scanning transmission electron microscopy reveals nanovoids that may account for the low Sn substitutional fraction in those layers. Conversely, the sample grown at high temperatures displayed abrupt interfaces, notably devoid of any voids, tin, or carbon-rich clusters. Finally, the surface roughness decreases with increasing growth temperature. These results show that atomic hydrogen provides a highly promising route to increase both Sn and C to achieve a strongly direct bandgap for optical gain and active silicon photonics.</jats:p>

Topics

• impedance spectroscopy
• surface
• cluster
• Carbon
• phase
• x-ray diffraction
• x-ray photoelectron spectroscopy
• semiconductor
• Hydrogen
• transmission electron microscopy
• Silicon
• void
• tin
• Raman spectroscopy