Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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PeopleLocationsStatistics
Naji, M.
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Schmidt, Matthias

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Helmholtz Centre for Environmental Research

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2024Future Lab Production Networking, Modeling and Optimization of the Industrial Production ; Zukunftslabor Produktion:Vernetzung, Modellierung und Optimierung in der industriellen Produktioncitations
  • 2024Zukunftslabor Produktioncitations
  • 2023Roadmap for focused ion beam technologies48citations
  • 2023Roadmap for focused ion beam technologies48citations
  • 2021Microbial Identification, High-Resolution Microscopy and Spectrometry of the Rhizosphere in Its Native Spatial Context25citations
  • 2020Surface cleaning and sample carrier for complementary high-resolution imaging techniquescitations
  • 2020Surface cleaning and sample carrier for complementary high-resolution imaging techniquescitations
  • 2020Detection of Pin Failure in Carbon Fiber Composites Using the Electro-Mechanical Impedance Method2citations

Places of action

Chart of shared publication
Kallisch, Jonas
2 / 2 shared
Walter, Jörg
2 / 2 shared
Hoffmann, Norbert
2 / 3 shared
Kramer, Kathrin
2 / 2 shared
Niederée, Claudia
2 / 2 shared
Dilger, Klaus
2 / 22 shared
Pachandrin, Slava
2 / 2 shared
Niemann, Karl Heinz
1 / 1 shared
Voss, Marvin
2 / 2 shared
Denkena, Berend
2 / 75 shared
Wunck, Christoph
2 / 2 shared
Nein, Marcus
2 / 2 shared
Rokicki, Markus
2 / 2 shared
Stürenburg, Lukas
2 / 2 shared
Niemann, Karl-Heinz
1 / 1 shared
Bandara, Chaturanga D.
1 / 2 shared
Stryhanyuk, Hryhoriy
3 / 3 shared
Davoudpour, Yalda
1 / 1 shared
Richnow, Hans H.
1 / 3 shared
Musat, Niculina
3 / 4 shared
Benettoni, Pietro
2 / 2 shared
Ye, Jia-Yu
1 / 1 shared
Ullrich, Maria K.
2 / 2 shared
Richnow, Hans-Hermann
1 / 1 shared
Wagner, Stephan
2 / 7 shared
Holbrook, Timothy R.
2 / 2 shared
Calabrese, Federica
2 / 2 shared
Griebe, Jan
1 / 1 shared
Reemtsma, Thorsten
2 / 6 shared
Zarejousheghani, Mashaalah
2 / 3 shared
Flyunt, Roman
2 / 2 shared
Richnow, Hans Hermann
1 / 1 shared
Griebel, Jan
1 / 7 shared
Ye, Jia Yu
1 / 1 shared
Käsgen, Johannes
1 / 1 shared
Haupt, Felix
1 / 1 shared
Bücker, Marcel
1 / 1 shared
Moll, Jochen
1 / 8 shared
Mehldau, Jörg
1 / 1 shared
Chart of publication period
2024
2023
2021
2020

Co-Authors (by relevance)

  • Kallisch, Jonas
  • Walter, Jörg
  • Hoffmann, Norbert
  • Kramer, Kathrin
  • Niederée, Claudia
  • Dilger, Klaus
  • Pachandrin, Slava
  • Niemann, Karl Heinz
  • Voss, Marvin
  • Denkena, Berend
  • Wunck, Christoph
  • Nein, Marcus
  • Rokicki, Markus
  • Stürenburg, Lukas
  • Niemann, Karl-Heinz
  • Bandara, Chaturanga D.
  • Stryhanyuk, Hryhoriy
  • Davoudpour, Yalda
  • Richnow, Hans H.
  • Musat, Niculina
  • Benettoni, Pietro
  • Ye, Jia-Yu
  • Ullrich, Maria K.
  • Richnow, Hans-Hermann
  • Wagner, Stephan
  • Holbrook, Timothy R.
  • Calabrese, Federica
  • Griebe, Jan
  • Reemtsma, Thorsten
  • Zarejousheghani, Mashaalah
  • Flyunt, Roman
  • Richnow, Hans Hermann
  • Griebel, Jan
  • Ye, Jia Yu
  • Käsgen, Johannes
  • Haupt, Felix
  • Bücker, Marcel
  • Moll, Jochen
  • Mehldau, Jörg
OrganizationsLocationPeople

article

Roadmap for focused ion beam technologies

  • Philipp, Patrick
  • Djurabekova, Flyura Gatifovna
  • Mazarov, Paul
  • Schmidt, Matthias
  • Osenberg, Markus
  • Michler, Johann
  • Manke, Ingo
  • Delobbe, Anne
  • Klingner, Nico
  • Dobrovolskiy, Oleksandr
  • Hobler, Gerhard
  • Córdoba, Rosa
  • Dunne, Peter
  • Perez-Murano, Francesc
  • Utke, Ivo
  • Rius, Gemma
  • Wirtz, Tom
  • Allen, Frances
  • Bischoff, Lothar
  • Gölzhäuser, Armin
  • Frese, Natalie
  • Manoccio, Mariachiara
  • Koelle, Dieter
  • Moll, Philip J. W.
  • Hoeflich, Katja
  • Krasheninnikov, Arkady
  • Hlawacek, Gregor
  • Mcelwee-White, Lisa
  • Castro, Dr. Olivier De
  • Möller, Wolfhard
Abstract

<jats:p>The focused ion beam (FIB) is a powerful tool for fabrication, modification, and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was originally intended for photomask repair in the semiconductor industry, there are now many different types of FIB that are commercially available. These instruments use a range of ion species and are applied broadly in materials science, physics, chemistry, biology, medicine, and even archaeology. The goal of this roadmap is to provide an overview of FIB instrumentation, theory, techniques, and applications. By viewing FIB developments through the lens of various research communities, we aim to identify future pathways for ion source and instrumentation development, as well as emerging applications and opportunities for improved understanding of the complex interplay of ion–solid interactions. We intend to provide a guide for all scientists in the field that identifies common research interest and will support future fruitful interactions connecting tool development, experiment, and theory. While a comprehensive overview of the field is sought, it is not possible to cover all research related to FIB technologies in detail. We give examples of specific projects within the broader context, referencing original works and previous review articles throughout.</jats:p>

Topics
  • impedance spectroscopy
  • theory
  • experiment
  • semiconductor
  • focused ion beam
  • Gallium