• Matsuda, Hiroyuki
• Iwamoto, Emi
• Hagiwara, Kenta
• Tanaka, Shin-Ichiro
• Ueno, Keiji
• Kobayashi, Takahiro
• Hashimoto, Eri
• Nakamura, Eiken
• Yano, Takayuki
• Okano, Yasuaki

Abstract

<jats:p>The photoelectron momentum microscope (PMM) in operation at BL6U, an undulator-based soft x-ray beamline at the UVSOR Synchrotron Facility, offers a new approach for μm-scale momentum-resolved photoelectron spectroscopy (MRPES). A key feature of the PMM is that it can very effectively reduce radiation-induced damage by directly projecting a single photoelectron constant energy contour in reciprocal space with a radius of a few Å−1 or real space with a radius of a few 100 μm onto a two-dimensional detector. This approach was applied to three-dimensional valence band structure E(k) and E(r) measurements (“stereography”) as functions of photon energy (hν), its polarization (e), detection position (r), and temperature (T). In this study, we described some examples of possible measurement techniques using a soft x-ray PMM. We successfully applied this stereography technique to μm-scale MRPES to selectively visualize the single-domain band structure of twinned face-centered-cubic Ir thin films grown on Al2O3(0001) substrates. The photon energy dependence of the photoelectron intensity on the Au(111) surface state was measured in detail within the bulk Fermi surface. By changing the temperature of 1T-TaS2, we clarified the variations in the valence band dispersion associated with chiral charge-density-wave phase transitions. Finally, PMMs for valence band stereography with various electron analyzers were compared, and the advantages of each were discussed.</jats:p>

Topics

• density
• impedance spectroscopy
• dispersion
• surface
• phase
• thin film
• phase transition
• two-dimensional
• band structure
• photoelectron spectroscopy
• twinned