Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2023Microwave annealing of silicon solar cells2citations

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Puthen Veettil, Binesh
1 / 7 shared
Hallam, Brett
1 / 5 shared
Chart of publication period
2023

Co-Authors (by relevance)

  • Puthen Veettil, Binesh
  • Hallam, Brett
OrganizationsLocationPeople

article

Microwave annealing of silicon solar cells

  • Zhang, Yuchao
  • Puthen Veettil, Binesh
  • Hallam, Brett
Abstract

<p>The microwave annealing of semiconductor devices has not been extensively researched and is rarely utilized in industry, yet it has the potential to significantly reduce the time and cost associated with large-volume semiconductor processing, such as the various heating and annealing processes required in the manufacture of photovoltaic modules. In this paper, we describe microwave annealing of silicon solar cells, the effective passivation of light-induced defects, and a reduction in light-induced degradation. We find that silicon solar cells are heated rapidly in a microwave field and that effective B-O defect passivation can be achieved by microwave processing in less than 2 s. Microwave annealing yields similar results as compared to rapid thermal annealing. </p>

Topics
  • impedance spectroscopy
  • semiconductor
  • laser emission spectroscopy
  • Silicon
  • defect
  • annealing