Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

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Publications (5/5 displayed)

  • 2023Heat treated graphene thin films for reduced void content of interlaminar enhanced CF/PEEK composites2citations
  • 2022The Role of Stacking Faults in the Enhancement of the a-b Plane Peak in Silver Ion-Irradiated Commercial MOD REBCO Wires8citations
  • 2021Shape of nanopores in track-etched polycarbonate membranes51citations
  • 2021A graphene film interlayer for enhanced electrical conductivity in a carbon-fibre/PEEK composite21citations
  • 2021Influence of direct deposition of dielectric materials on the optical response of monolayer WS213citations

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Kluth, Patrick
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Kreider, Peter B.
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Compston, Paul
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Sommacal, Silvano
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Knibbe, Ruth
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Strickland, Nicholas M.
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Soman, Arya A.
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Wimbush, Stuart C.
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Rupich, Martin W.
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Li, Ming
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Apel, Pavel
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Kirby, Nigel
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Trautmann, Christina
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Kreider, Peter
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Bhattacharyya, Semonti
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Truscott, Andrew
1 / 6 shared
Ou, Qingdong
1 / 2 shared
Yun, Tinghe
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Wurdack, Matthias
1 / 3 shared
Fuhrer, Michael S.
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Daeneke, Torben
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Nguyen, Chung Kim
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Pieczarka, Maciej
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Co-Authors (by relevance)

  • Kluth, Patrick
  • Kreider, Peter B.
  • Compston, Paul
  • Sommacal, Silvano
  • Knibbe, Ruth
  • Strickland, Nicholas M.
  • Soman, Arya A.
  • Wimbush, Stuart C.
  • Rupich, Martin W.
  • Li, Ming
  • Apel, Pavel
  • Kirby, Nigel
  • Mota-Santiago, Pablo
  • Wen, Qi
  • Lizunov, Nikolay
  • Trautmann, Christina
  • Leow, Christopher
  • Tricoli, Antonio
  • Kreider, Peter
  • Bhattacharyya, Semonti
  • Truscott, Andrew
  • Ou, Qingdong
  • Yun, Tinghe
  • Wurdack, Matthias
  • Fuhrer, Michael S.
  • Daeneke, Torben
  • Nguyen, Chung Kim
  • Pieczarka, Maciej
OrganizationsLocationPeople

article

Influence of direct deposition of dielectric materials on the optical response of monolayer WS2

  • Bhattacharyya, Semonti
  • Truscott, Andrew
  • Ou, Qingdong
  • Yun, Tinghe
  • Wurdack, Matthias
  • Notthoff, Christian
  • Fuhrer, Michael S.
  • Daeneke, Torben
  • Nguyen, Chung Kim
  • Pieczarka, Maciej
Abstract

<p>We investigate the effects of direct deposition of different dielectric materials (AlO<sub>x</sub>, SiO<sub>x</sub>, SiN<sub>x</sub>) onto atomically thin TMDC WS<sub>2</sub> on its optical response using atomic layer deposition (ALD), electron beam evaporation (EBE), plasma-enhanced chemical vapor deposition (PECVD), and magnetron sputtering. The photoluminescence measurements reveal quenching of the excitonic emission after all deposition processes, which is linked to the increased level of charge doping and associated rise of the trion emission and/or the localized (bound) exciton emission. Furthermore, Raman spectroscopy allows us to clearly correlate the observed changes in excitonic emission with the increased levels of lattice disorder and defects. In particular, we show that the different doping levels in a monolayer WS<sub>2</sub> capped by a dielectric material are strongly related to the defects in the WS<sub>2</sub> crystal introduced by all capping methods, except for ALD. The strong charge doping in the ALD-capped sample seems to be caused by other factors, such as deviations in the dielectric layer stoichiometry or chemical reactions on the monolayer surface, which makes ALD distinct from all other techniques. Overall, the EBE process results in the lowest level of doping and defect densities and in the largest spectral weight of the exciton emission in the PL. Sputtering is revealed as the most aggressive dielectric capping method for WS<sub>2</sub>, fully quenching its optical response. Our results demonstrate and quantify the effects of direct deposition of dielectric materials onto monolayer WS<sub>2</sub>, which can provide valuable guidance for the efforts to integrate monolayer TMDCs into functional optoelectronic devices.</p>

Topics
  • impedance spectroscopy
  • surface
  • photoluminescence
  • defect
  • Raman spectroscopy
  • evaporation
  • chemical vapor deposition
  • quenching
  • atomic layer deposition