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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Thammaiah, Shivakumar D.
Aalborg University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (3/3 displayed)
- 2021Nanometer-thin pure boron CVD layers as material barrier to Au or Cu metallization of Sicitations
- 2020Investigation of Pd/MoOx/n-Si diodes for bipolar transistor and light-emitting device applicationscitations
- 2019Nanometer-thin pure B layers Grown by MBE as metal diffusion barrier on GaN Diodescitations
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article
Investigation of Pd/MoOx/n-Si diodes for bipolar transistor and light-emitting device applications
Abstract
<p>Sub-stoichiometric molybdenum oxide (MoO x) has recently been investigated for application in high efficiency Si solar cells as a "hole selective"contact. In this paper, we investigate the electrical and light-emitting properties of MoO x-based contacts on Si from the viewpoint of realizing functional bipolar devices such as light-emitting diodes (LEDs) and transistors without any impurity doping of the Si surface. We realized diodes on n-type Si substrates using e-beam physical vapor deposition of Pd/MoO x contacts and compared their behavior to implanted p +n-Si diodes as a reference. In contrast to majority-carrier dominated conduction that occurs in conventional Schottky diodes, Pd/MoO x/n-Si diodes show minority-carrier dominated charge transport with I-V, C-V, and light-emitting characteristics comparable to implanted counterparts. Utilizing such MoO x-based contacts, we also demonstrate a lateral bipolar transistor concept without employing any doped junctions. A detailed C-V analysis confirmed the excessive band-bending in Si corresponding to a high potential barrier (> - > 0.90 V) at the MoO x/n-Si interface which, along with the observed amorphous SiO x(Mo) interlayer, plays a role in suppressing the majority-carrier current. An inversion layer at the n-Si surface was also identified comprising a sheet carrier density greater than 8.6 × 10 11 cm - 2, and the MoO x layer was found to be conductive though with a very high resistivity in the 10 4 ω-cm range. We refer to these diodes as metal/non-insulator/semiconductor diodes and show with our device simulations that they can be mimicked as high-barrier Schottky diodes with an induced inversion layer at the interface. </p>