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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Lähnemann, Jonas
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (11/11 displayed)
- 2022Molecular beam epitaxy of single-crystalline bixbyite (In<SUB>1<SUB>−x</SUB>Ga<SUB>x</SUB> ) 2</SUB>O<SUB>3</SUB> films (x ≤0.18 ): Structural properties and consequences of compositional inhomogeneitycitations
- 2021Bandgap widening and behavior of Raman-active phonon modes of cubic single-crystalline (In,Ga)<SUB>2</SUB>O<SUB>3</SUB> alloy filmscitations
- 2020Beam damage of single semiconductor nanowires during X-ray nano beam diffraction experimentscitations
- 2020Plasma-assisted molecular beam epitaxy of NiO on GaN(00.1)citations
- 2014Luminescence associated with stacking faults in GaNcitations
- 2014Stacking faults as quantum wells in nanowires: Density of states, oscillator strength, and radiative efficiencycitations
- 2013Spatially resolved investigation of strain and composition variations in (In,Ga)N/GaN epilayerscitations
- 2012Optical switching and related structural properties of epitaxial Ge<SUB>2</SUB>Sb<SUB>2</SUB>Te<SUB>5</SUB> filmscitations
- 2012Direct experimental determination of the spontaneous polarization of GaNcitations
- 2011Self-assisted nucleation and vapor-solid growth of InAs nanowires on bare Si (111)citations
- 2010GaN and ZnO nanostructurescitations
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article
Plasma-assisted molecular beam epitaxy of NiO on GaN(00.1)
Abstract
The growth of NiO on GaN(00.1) substrates by plasma-assisted molecular beam epitaxy under oxygen-rich conditions was investigated at growth temperatures between 100 <SUP>°</SUP> C and 850 <SUP>°</SUP> C . Epitaxial growth of NiO(111) with two rotational domains, with epitaxial relation NiO ( 1 1 ̄ 0 ) ‖ GaN ( 11.0 ) and NiO ( 10 1 ̄ ) ‖ GaN ( 11.0 ), was observed by X-ray diffraction and confirmed by in situ reflection high-energy electron diffraction as well as transmission electron microscopy (TEM) and electron backscatter diffraction. With respect to the high lattice mismatch of 8.1% and a measured low residual tensile layer strain, growth by lattice matching epitaxy or domain-matching epitaxy is discussed. The morphology measured by atomic force microscopy showed a grainy surface, probably arising from the growth by columnar rotational domains visible in TEM micrographs. The domain sizes measured by AFM and TEM increase with the growth temperature, indicating an increasing surface diffusion length. Growth at 850 <SUP>°</SUP> C , however, involved local decomposition of the GaN substrate that leads to an interfacial β - <SUB>Ga 2</SUB> <SUB>O 3</SUB> ( 2 ̄ 01 ) layer and a high NiO surface roughness. Raman measurements of the quasiforbidden one-phonon peak indicate increasing layer quality (decreasing defect density) with increasing growth temperature....