Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Bid, Aveek

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2022Observation of hidden electronic phases in 1T-TaS<SUB>2</SUB> through conductance fluctuation spectroscopycitations
  • 2022Observation of Quantum Griffith's singularity and anomalous metal in LaScO<SUB>3</SUB>/SrTiO<SUB>3</SUB> heterostructurecitations
  • 2022Temperature dependent cloaking of the Quantum Griffiths Singularity in LaScO$_3$/SrTiO$_3$ heterostructurescitations
  • 2019Resistance fluctuation spectroscopy of thin films of 3D topological insulator BiSbTeSe<SUB>1.6</SUB>5citations
  • 2018Strain-induced continuous transition from Weak localization regime to Strong localization regime in a doped Mott Insulatorcitations
  • 2017Effect of microstructure on the electronic transport properties of epitaxial CaRuO<SUB>3</SUB> thin films5citations
  • 2016Structural instability and phase co-existence driven non-Gaussian resistance fluctuations in metal nanowires at low temperatures1citations
  • 2014Probing a spin-glass state in SrRuO<SUB>3</SUB> thin films through higher-order statistics of resistance fluctuations12citations
  • 2005Experimental study of Rayleigh instability in metallic nanowires using resistance fluctuations measurements from 77K to 375K7citations

Places of action

Chart of shared publication
Kundu, Hemanta Kumar
3 / 3 shared
Sruthi, S.
1 / 1 shared
Bhotla, Prasad Vishnu
1 / 1 shared
Dogra, Anjana
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Kaur, Simrandeep
2 / 2 shared
Narayanan, Rajesh
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Kumar, Sumit
2 / 13 shared
Vojta, Thomas
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Mitra, Chiranjib
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Gopal, R. K.
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Kant, Raushan
1 / 1 shared
Singh, Sourabh
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Biswas, Sangram
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Daptary, Gopinath
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Bisht, Ravindra
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Raychaudhuri, Arup
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Sil, Anomitra
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Sow, Chanchal
2 / 5 shared
Daptary, Gopi Nath
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Kumar, P. S. Anil
2 / 4 shared
Chiniwar, Santosh
1 / 1 shared
Sarkar, Suman
1 / 2 shared
Raychaudhuri, A. K.
1 / 3 shared
Raychaudhuri, Arup K.
1 / 1 shared
Bora, Achyut
1 / 1 shared
Chart of publication period
2022
2019
2018
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Co-Authors (by relevance)

  • Kundu, Hemanta Kumar
  • Sruthi, S.
  • Bhotla, Prasad Vishnu
  • Dogra, Anjana
  • Kaur, Simrandeep
  • Narayanan, Rajesh
  • Kumar, Sumit
  • Vojta, Thomas
  • Mitra, Chiranjib
  • Gopal, R. K.
  • Kant, Raushan
  • Singh, Sourabh
  • Biswas, Sangram
  • Daptary, Gopinath
  • Bisht, Ravindra
  • Raychaudhuri, Arup
  • Sil, Anomitra
  • Sow, Chanchal
  • Daptary, Gopi Nath
  • Kumar, P. S. Anil
  • Chiniwar, Santosh
  • Sarkar, Suman
  • Raychaudhuri, A. K.
  • Raychaudhuri, Arup K.
  • Bora, Achyut
OrganizationsLocationPeople

article

Resistance fluctuation spectroscopy of thin films of 3D topological insulator BiSbTeSe<SUB>1.6</SUB>

  • Mitra, Chiranjib
  • Gopal, R. K.
  • Bid, Aveek
  • Kant, Raushan
  • Singh, Sourabh
  • Biswas, Sangram
Abstract

Despite several years of studies, the origin of slow-kinetics of charge-carriers at the surface-states of strong topological insulators remains abstruse. In this article, we report on studies of charge dynamics of thin films of the 3-dimensional strong topological insulator material BiSbTeSe<SUB>1.6</SUB> grown by pulsed laser deposition (PLD). The bulk of the films was insulating, making them suitable for transport studies of topological surface-states. Despite being disordered and granular, the films show definite signatures of the presence of topological surface-states with electronic transport coherence lengths comparable to those of high-quality grown films grown by molecular beam epitaxy (MBE). At high temperatures, the resistance fluctuations in these films were found to be dominated by trapping-detrapping of charge carriers from multiple defect-levels of the bulk. At low temperatures, fluctuations in the resistance of surface-states, arising due to the coupling of surface transport with defect dynamics in bulk, determine the noise. We thus confirm that the measured low-frequency fluctuations in these films, over the entire temperature range of 20 mK-300 K, are determined primarily by bulk defect density. The magnitude of noise was comparable to that measured on bulk-exfoliated films but was slightly higher than that in MBE grown films. Our studies establish PLD as a viable route to develop high-quality topological insulator materials....

Topics
  • density
  • surface
  • thin film
  • defect
  • pulsed laser deposition
  • spectroscopy