Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2021Wide range and highly linear signal processed systematic humidity sensor array using Methylene Blue and Graphene composite13citations
  • 2018Understanding the optics of industrial black silicon13citations

Places of action

Chart of shared publication
Hassan, Gul
1 / 1 shared
Shaukat, Rayyan Ali
1 / 1 shared
Saqib, Qazi Muhammad
1 / 1 shared
Kim, Jungmin
1 / 1 shared
Bae, Jinho
1 / 2 shared
Mcintosh, Keith
1 / 2 shared
Cruz-Campa, Jose
1 / 1 shared
Fung, Tsun Hang
1 / 5 shared
Abbott, Malcolm
1 / 4 shared
Chart of publication period
2021
2018

Co-Authors (by relevance)

  • Hassan, Gul
  • Shaukat, Rayyan Ali
  • Saqib, Qazi Muhammad
  • Kim, Jungmin
  • Bae, Jinho
  • Mcintosh, Keith
  • Cruz-Campa, Jose
  • Fung, Tsun Hang
  • Abbott, Malcolm
OrganizationsLocationPeople

document

Understanding the optics of industrial black silicon

  • Mcintosh, Keith
  • Cruz-Campa, Jose
  • Fung, Tsun Hang
  • Abbott, Malcolm
  • Khan, Muhammad Umair
Abstract

<p>Industrial scale black silicon texturing has become a topic of increasing importance as a method for enabling lower cost multicrystalline silicon wafers through diamond wire sawing, as well as for its potential to provide improved efficiencies through enhanced optical characteristics. Two different texturing processes have emerged as candidates for mainstream industrial uptake, metal catalyzed chemical etching (MCCE) and reactive ion etching (RIE). However, these techniques can produce substantially different textures and both provide a wide parameter space allowing for various feature shapes and sizes to be produced. The surface texture not only determines the total reflectance of a solar cell, but also impacts the light trapping and subsequent absorption through scattering. Here, we carry out a detailed analysis on a representative range of both MCCE and RIE textures on multiple substrate types in order to further develop the fundamental understanding of how these specific surface morphologies impact the optical characteristics. This will better enable integration with other process conditions as well as optimization between optical and electrical requirements.</p>

Topics
  • surface
  • texture
  • Silicon
  • wire
  • plasma etching