Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2018Characterization of trap states in perovskite films by simultaneous fitting of steady-state and transient photoluminescence measurements15citations
  • 2017Light and Electrically Induced Phase Segregation and Its Impact on the Stability of Quadruple Cation High Bandgap Perovskite Solar Cells132citations
  • 2017Rubidium Multication Perovskite with Optimized Bandgap for Perovskite-Silicon Tandem with over 26% Efficiency487citations
  • 2017Inverted Hysteresis in CH3NH3PbI3 Solar Cells83citations

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Chart of shared publication
White, Thomas P.
4 / 8 shared
Shen, Heping
3 / 6 shared
Mulmudi, Hemant Kumar
1 / 1 shared
Duong, The
3 / 10 shared
Peng, Jun
3 / 4 shared
Wu, Nandi
1 / 2 shared
Catchpole, Kylie
2 / 8 shared
Wu, Yiliang
2 / 6 shared
Lockrey, Mark
1 / 3 shared
Kho, Teng Choon
1 / 1 shared
Wang, Er Chien
1 / 1 shared
Li, Wei
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Cheng, Yi Bing
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Jacobs, Daniel
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Mcintosh, Keith
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Zin, Ngwe
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Fong, Kean Chern
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Franklin, Evan
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Catchpole, Kylie R.
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Wen, Xiaoming
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Jacobs, Daniel A.
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2018
2017

Co-Authors (by relevance)

  • White, Thomas P.
  • Shen, Heping
  • Mulmudi, Hemant Kumar
  • Duong, The
  • Peng, Jun
  • Wu, Nandi
  • Catchpole, Kylie
  • Wu, Yiliang
  • Lockrey, Mark
  • Kho, Teng Choon
  • Wang, Er Chien
  • Li, Wei
  • Cheng, Yi Bing
  • Jacobs, Daniel
  • Mcintosh, Keith
  • Zin, Ngwe
  • Fong, Kean Chern
  • Wu, Yi Liang
  • Franklin, Evan
  • Catchpole, Kylie R.
  • Wen, Xiaoming
  • Jacobs, Daniel A.
OrganizationsLocationPeople

article

Characterization of trap states in perovskite films by simultaneous fitting of steady-state and transient photoluminescence measurements

  • White, Thomas P.
  • Fu, Xiao
Abstract

<p>Understanding carrier recombination mechanisms and quantifying recombination dynamics are key to improving the performance of state-of-the-art perovskite solar cells. Here, we present a method to quantify the quality of perovskite thin films using a combination of steady-state and transient photoluminescence measurements. The combined experimental datasets are fitted using a single, general recombination model, from which detailed trap and recombination parameters can be extracted, and the accuracy of the fitted values is estimated. This approach expands the application of photoluminescence measurements to include quantitative evaluation of the most relevant defect characteristics, including trap density, energy level, and carrier capture coefficients. We apply this approach to compare perovskite films of the widely studied methyl-ammonium lead iodide (MAPbI<sub>3</sub>) with the high performance quadruple-cation, mixed-halide composition Cs<sub>0.07</sub>Rb<sub>0.03</sub>(FA<sub>0.85</sub>MA<sub>0.15</sub>)<sub>0.9</sub>Pb(I<sub>0.85</sub>Br<sub>0.15</sub>)<sub>3</sub>. Our quantitative analysis of trap properties in these perovskite films suggests that the superior performance of the quadruple cation films may be due to a greatly reduced electron capture coefficient, rather than a significant reduction in the trap density.</p>

Topics
  • density
  • perovskite
  • impedance spectroscopy
  • photoluminescence
  • thin film
  • defect
  • quantitative determination method