Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Watanabe, Heiji

  • Google
  • 2
  • 9
  • 6

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2023Impact of Sn incorporation on sputter epitaxy of GeSn1citations
  • 2018Annealing behavior of open spaces in AlON films studied by monoenergetic positron beams5citations

Places of action

Chart of shared publication
Shimura, Takayoshi
1 / 1 shared
Kuniyoshi, Mizuki
1 / 1 shared
Hoshihara, Masaki
1 / 1 shared
Tanaka, Nobuyuki
1 / 1 shared
Hugenschmidt, Christoph
1 / 5 shared
Egger, Werner
1 / 7 shared
Koschine, Tönjes
1 / 1 shared
Dickmann, Marcel
1 / 7 shared
Yamada, Takahiro
1 / 2 shared
Chart of publication period
2023
2018

Co-Authors (by relevance)

  • Shimura, Takayoshi
  • Kuniyoshi, Mizuki
  • Hoshihara, Masaki
  • Tanaka, Nobuyuki
  • Hugenschmidt, Christoph
  • Egger, Werner
  • Koschine, Tönjes
  • Dickmann, Marcel
  • Yamada, Takahiro
OrganizationsLocationPeople

article

Annealing behavior of open spaces in AlON films studied by monoenergetic positron beams

  • Hugenschmidt, Christoph
  • Watanabe, Heiji
  • Egger, Werner
  • Koschine, Tönjes
  • Dickmann, Marcel
  • Yamada, Takahiro
Abstract

<jats:p>The impact of nitridation on open spaces in thin AlONx films deposited by a reactive sputtering technique was studied by using monoenergetic positron beams. For AlONx films with x = 0%–15%, positrons were found to annihilate from trapped states in open spaces, which coexist intrinsically in an amorphous structure with three different sizes. Nitrogen incorporation into the Al2O3 film increased the size of the open spaces, and their density increased as the post-deposition annealing temperature increased. The effect of nitrogen incorporation, however, diminished at x = 25%. The observed change in the network structure was associated with the formation of a stable amorphous structure, which we could relate to the electrical properties of AlONx/SiO2/Si gate stacks.</jats:p>

Topics
  • Deposition
  • density
  • amorphous
  • reactive
  • Nitrogen
  • annealing