Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2016Electron energy loss spectroscopy of plasmon resonances in titanium nitride thin films17citations
  • 2015Evidence for bandgap opening in buckled epitaxial graphene from ultrafast time-resolved terahertz spectroscopy7citations
  • 2003Acoustic detection of microbubble formation induced by enhanced optical breakdown of silver/dendrimer nanocomposites21citations

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Chart of shared publication
Guler, Urcan
1 / 1 shared
Shalaev, Vladimir
1 / 1 shared
Zhou, Xiuli
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Herzing, Andrew A.
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Boltasseva, Alexandra
1 / 23 shared
Liu, Gang
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Conrad, Edward H.
1 / 1 shared
Wang, Feng
1 / 20 shared
Cohen, Philip I.
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Rothwell, Sara
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Feldman, Leonard C.
1 / 4 shared
Mihnev, Momchil
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Milas, Susanne M.
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Odonnell, Matthew
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Emelianov, Stanislav
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Hollman, Kyle W.
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Balogh, Lajos P.
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Baker, James R.
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Ye, Jing Yong
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Co-Authors (by relevance)

  • Guler, Urcan
  • Shalaev, Vladimir
  • Zhou, Xiuli
  • Herzing, Andrew A.
  • Boltasseva, Alexandra
  • Liu, Gang
  • Conrad, Edward H.
  • Wang, Feng
  • Cohen, Philip I.
  • Rothwell, Sara
  • Feldman, Leonard C.
  • Mihnev, Momchil
  • Milas, Susanne M.
  • Odonnell, Matthew
  • Emelianov, Stanislav
  • Hollman, Kyle W.
  • Balogh, Lajos P.
  • Baker, James R.
  • Ye, Jing Yong
OrganizationsLocationPeople

article

Electron energy loss spectroscopy of plasmon resonances in titanium nitride thin films

  • Guler, Urcan
  • Norris, Theodore B.
  • Shalaev, Vladimir
  • Zhou, Xiuli
  • Herzing, Andrew A.
  • Boltasseva, Alexandra
Abstract

<jats:p>The plasmon resonance characteristics of refractory TiN thin films were analyzed using electron energy-loss spectroscopy (EELS). A bulk plasmon resonance was observed at 2.81 eV and a weaker surface plasmon resonance peak was detected at 2.05 eV. These findings are compared to finite-difference time-domain simulations based on measured optical data. The calculated values for both the bulk and surface resonances (2.74 eV and 2.15 eV, respectively) show reasonable agreement with those measured via EELS. The amplitude of the experimentally observed surface resonance was weaker than that typically encountered in noble metal nanostructures, and this is discussed in the context of electron density and reduced spatial confinement of the resonance mode in the thin-film geometry.</jats:p>

Topics
  • density
  • impedance spectroscopy
  • surface
  • thin film
  • simulation
  • nitride
  • titanium
  • refractory
  • tin
  • electron energy loss spectroscopy