Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2015Highly stable thin film transistors using multilayer channel structure43citations
  • 2015Electroforming free resistive switching memory in two-dimensional VOx nanosheets30citations
  • 2013In situ growth of p and n-type graphene thin films and diodes by pulsed laser deposition21citations
  • 2012Modeling the transport properties of epitaxially grown thermoelectric oxide thin films using spectroscopic ellipsometry8citations

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Chart of shared publication
Nayak, Pradipta K.
2 / 2 shared
Anjum, D. H.
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Wang, Zhenwei
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Nagaraju, D. H.
1 / 1 shared
Sarath Kumar, S. R.
2 / 7 shared
Khan, M. A.
1 / 9 shared
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2015
2013
2012

Co-Authors (by relevance)

  • Nayak, Pradipta K.
  • Anjum, D. H.
  • Wang, Zhenwei
  • Nagaraju, D. H.
  • Sarath Kumar, S. R.
  • Khan, M. A.
OrganizationsLocationPeople

article

Electroforming free resistive switching memory in two-dimensional VOx nanosheets

  • Nagaraju, D. H.
  • Hedhili, M. N.
Abstract

We report two-dimensional VOx nanosheets containing multi-oxidation states (V5+, V4+, and V3+), prepared by a hydrothermal process for potential applications in resistive switching devices. The experimental results demonstrate a highly reproducible, electroforming-free, low SET bias bipolar resistive switching memory performance with endurance for more than 100 cycles maintaining OFF/ON ratio of ∼60 times. These devices show better memory performance as compared to previously reported VOx thin film based devices. The memory mechanism in VOx is proposed to be originated from the migration of oxygen vacancies/ions, an influence of the bottom electrode and existence of multi-oxidation states.

Topics
  • impedance spectroscopy
  • thin film
  • Oxygen
  • two-dimensional