Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2015Enhanced electrical and magnetic properties in La<SUB>0.7</SUB>Sr<SUB>0.3</SUB>MnO<SUB>3</SUB> thin films deposited on CaTiO<SUB>3</SUB>-buffered silicon substrates20citations

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Chart of shared publication
Zander, W.
1 / 6 shared
Schlom, D. G.
1 / 25 shared
Méchin, L.
1 / 1 shared
Guillet, B.
1 / 2 shared
Pan, X. Q.
1 / 10 shared
Schiffer, P.
1 / 8 shared
Heeg, T.
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Wu, S.
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Katz, M.
1 / 2 shared
Adamo, C.
1 / 9 shared
Schubert, J.
1 / 36 shared
Mercone, S.
1 / 7 shared
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2015

Co-Authors (by relevance)

  • Zander, W.
  • Schlom, D. G.
  • Méchin, L.
  • Guillet, B.
  • Pan, X. Q.
  • Schiffer, P.
  • Heeg, T.
  • Wu, S.
  • Katz, M.
  • Adamo, C.
  • Schubert, J.
  • Mercone, S.
OrganizationsLocationPeople

article

Enhanced electrical and magnetic properties in La<SUB>0.7</SUB>Sr<SUB>0.3</SUB>MnO<SUB>3</SUB> thin films deposited on CaTiO<SUB>3</SUB>-buffered silicon substrates

  • Zander, W.
  • Schlom, D. G.
  • Méchin, L.
  • Guillet, B.
  • Pan, X. Q.
  • Schiffer, P.
  • Heeg, T.
  • Wu, S.
  • Katz, M.
  • Adamo, C.
  • Schubert, J.
  • Routoure, J. -M.
  • Mercone, S.
Abstract

We investigate the suitability of an epitaxial CaTiO<SUB>3</SUB> buffer layer deposited onto (100) Si by reactive molecular-beam epitaxy (MBE) for the epitaxial integration of the colossal magnetoresistive material La<SUB>0.7</SUB>Sr<SUB>0.3</SUB>MnO<SUB>3</SUB> with silicon. The magnetic and electrical properties of La<SUB>0.7</SUB>Sr<SUB>0.3</SUB>MnO<SUB>3</SUB> films deposited by MBE on CaTiO<SUB>3</SUB>-buffered silicon (CaTiO<SUB>3</SUB>/Si) are compared with those deposited on SrTiO<SUB>3</SUB>-buffered silicon (SrTiO<SUB>3</SUB>/Si). In addition to possessing a higher Curie temperature and a higher metal-to-insulator transition temperature, the electrical resistivity and 1/f noise level at 300 K are reduced by a factor of two in the heterostructure with the CaTiO<SUB>3</SUB> buffer layer. These results are relevant to device applications of La<SUB>0.7</SUB>Sr<SUB>0.3</SUB>MnO<SUB>3</SUB> thin films on silicon substrates....

Topics
  • resistivity
  • thin film
  • reactive
  • Silicon
  • Curie temperature