Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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CEA LETI

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2023Homo-epitaxial growth of LiNbO3 thin films by Pulsed Laser deposition6citations
  • 2019Atomistic modelling of diamond-type Si x Ge y C z Sn1− x − y − z crystals for realistic transmission electron microscopy image simulationscitations
  • 2019Atomistic modelling of diamond-type Si<i>x</i>Ge<i>y</i>C<i>z</i>Sn1−<i>x</i>−<i>y</i>−<i>z</i> crystals for realistic transmission electron microscopy image simulationscitations
  • 2018Impact of Hydrogen on Graphene-based Materials: Atomistic Modeling and Simulation of HRSTEM Imagescitations
  • 2016Measurement of energy‐loss anisotropy along [001] in monoclinic hafnia and comparison with ab‐initio simulationscitations
  • 2014Evidence for anisotropic dielectric properties of monoclinic hafnia using valence electron energy-loss spectroscopy in high-resolution transmission electron microscopy and <i>ab initio</i> time-dependent density-functional theory16citations
  • 2013Measurement of Complex Conductance in the PHz Frequency Range with Subnanometric Spatial Resolution: Application to the Grain Boundary of Monoclinic Hafnia1citations
  • 2008Evaluation of ellipsometric porosimetry for in‐line characterization of ultra low‐κ dielectrics12citations
  • 2006Influence of electron-beam and ultraviolet treatments on low-k porous dielectrics27citations

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Chart of shared publication
Templier, Roselyne
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Rouchon, Denis
1 / 11 shared
Sauze, Laura
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Dupont, Florian
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Vaxelaire, Nicolas
1 / 9 shared
Pierre, François
1 / 2 shared
Bousquet, Marie
1 / 7 shared
Remiens, Denis
1 / 37 shared
Rodriguez, Guillaume
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Jaillet, Leonard
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Redon, Stephane
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Jaillet, Léonard
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Olevano, Valerio
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Bernier, Nicolas
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Colliex, Christian
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Sottile, F.
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Hung, L.
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Olevano, V.
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Blaise, P.
1 / 2 shared
Zobelli, A.
1 / 2 shared
Zenasni, A.
1 / 5 shared
Cetre, S.
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Licitra, C.
2 / 5 shared
Darnon, M.
1 / 2 shared
Chapelon, L. L.
1 / 2 shared
Fontaine, H.
1 / 2 shared
Bertin, F.
1 / 7 shared
Chevolleau, T.
1 / 4 shared
Martinez, E.
1 / 12 shared
Friec, Y. Le
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Imbert, G.
1 / 2 shared
Rochat, N.
1 / 10 shared
Chart of publication period
2023
2019
2018
2016
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Co-Authors (by relevance)

  • Templier, Roselyne
  • Rouchon, Denis
  • Sauze, Laura
  • Dupont, Florian
  • Vaxelaire, Nicolas
  • Pierre, François
  • Bousquet, Marie
  • Remiens, Denis
  • Rodriguez, Guillaume
  • Jaillet, Leonard
  • Redon, Stephane
  • Rousse, François
  • Jaillet, Léonard
  • Olevano, Valerio
  • Bernier, Nicolas
  • Colliex, Christian
  • Sottile, F.
  • Hung, L.
  • Olevano, V.
  • Blaise, P.
  • Zobelli, A.
  • Zenasni, A.
  • Cetre, S.
  • Licitra, C.
  • Darnon, M.
  • Chapelon, L. L.
  • Fontaine, H.
  • Bertin, F.
  • Chevolleau, T.
  • Martinez, E.
  • Friec, Y. Le
  • Imbert, G.
  • Rochat, N.
OrganizationsLocationPeople

article

Evidence for anisotropic dielectric properties of monoclinic hafnia using valence electron energy-loss spectroscopy in high-resolution transmission electron microscopy and <i>ab initio</i> time-dependent density-functional theory

  • Sottile, F.
  • Hung, L.
  • Guedj, Cyril
  • Olevano, V.
  • Blaise, P.
  • Zobelli, A.
Abstract

<jats:p>The effect of nanocrystal orientation on the energy loss spectra of monoclinic hafnia (m-HfO2) is measured by high resolution transmission electron microscopy (HRTEM) and valence energy loss spectroscopy (VEELS) on high quality samples. For the same momentum-transfer directions, the dielectric properties are also calculated ab initio by time-dependent density-functional theory (TDDFT). Experiments and simulations evidence anisotropy in the dielectric properties of m-HfO2, most notably with the direction-dependent oscillator strength of the main bulk plasmon. The anisotropic nature of m-HfO2 may contribute to the differences among VEELS spectra reported in literature. The good agreement between the complex dielectric permittivity extracted from VEELS with nanometer spatial resolution, TDDFT modeling, and past literature demonstrates that the present HRTEM-VEELS device-oriented methodology is a possible solution to the difficult nanocharacterization challenges given in the International Technology Roadmap for Semiconductors.</jats:p>

Topics
  • density
  • impedance spectroscopy
  • theory
  • experiment
  • simulation
  • semiconductor
  • strength
  • anisotropic
  • transmission electron microscopy