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| Naji, M. |
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Sikorski, Krzysztof
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Publications (5/5 displayed)
- 2014Effect of grain size on the melting point of confined thin aluminum filmscitations
- 2009Structure of Al–Ni intermetallic composite layers produced on the Inconel 600 by the glow discharge enhanced-PACVD methodcitations
- 2008Structure and properties of the multilayers produced on Inconel 600 by the PACVD method with the participation of trimethylaluminum vapours
- 2007Composite layers produced on the Ti6Al2Mo2Cr titanium alloy by the PAMOCVD method
- 2004Phase transformations in ball milled AISI 316L stainless steel powder and the microstructure of the steel obtained by its sintering
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article
Effect of grain size on the melting point of confined thin aluminum films
Abstract
The melting of aluminum thin film was studied by a molecular dynamics (MD) simulationtechnique. The effect of the grain size and type of confinement was investigated for aluminum film with a constant thickness of 4 nm. The results show that coherent intercrystalline interface suppress the transition of solid aluminum into liquid, while free-surface gives melting point depression. The mechanism of melting of polycrystalline aluminum thin film was investigated. It was found that melting starts at grain boundaries and propagates to grain interiors. The melting point was calculated from the Lindemann index criterion, taking into account only atoms near to grain boundaries. This made it possible to extend melting point calculations to bigger grains, which require a long time (in the MD scale) to be fully molten. The results show that 4 nm thick film of aluminum melts at a temperature lower than the melting point of bulk aluminum (933 K) only when the grain size is reduced to 6 nm.VC2014 AIP Publishing LLC