| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Cros, Dominique
University of Limoges
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (16/16 displayed)
- 2021Enhanced tunability and temperature-dependent dielectric characteristics at microwaves of K0.5Na0.5NbO3 thin films epitaxially grown on (100)MgO substratescitations
- 2021Hybridization of additive manufacturing processes to build ceramic/metal parts: Example of HTCCcitations
- 2020Hybridization of additive manufacturing processes to build ceramic/metal parts: Example of LTCCcitations
- 2016BST thin film capacitors integrated within a frequency tunable antenna
- 2014Intercomparison of Permittivity Measurement Techniques for Ferroelectric Thin Layerscitations
- 2011Microwave properties of semi-insulating silicon carbide between 10 and 40 GHz and at cryogenic temperaturescitations
- 2010Detrapping and retrapping of free carriers in nominally pure single crystal GaP, GaAs, and 4H–SiC semiconductors under light illumination at cryogenic temperaturescitations
- 2010High permeability and high permittivity heterostructures for the miniaturization of Radiofrequency components
- 2010A 380-420 MHz Two Pole tunable filter using new ferroelectric composite capacitors
- 2009Filter Synthesis using Shear Wave Piezoelectric Layer Resonators
- 2009Magnetodielectric Thin Film Heterostructure With High Permeability and Permittivity
- 2008Characterization of materials and mode structure of high-Q resonators using Bragg confined modes
- 2008Modified permittivity observed in bulk gallium arsenide and gallium phosphide samples at 50 K using the whispering gallery mode methodcitations
- 2008Low-loss materials for high -factor Bragg reflector resonatorscitations
- 2007Pulsed laser deposition o aluminum nitride thin films for FBAR applicationscitations
- 2003Characterization of a spherically symmetric fused-silica-loaded cavity microwave resonatorcitations
Places of action
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article
Intercomparison of Permittivity Measurement Techniques for Ferroelectric Thin Layers
Abstract
The dielectric properties of a KTa0.65Nb0.35O3 (KTN) ferroelectric composition for a submicronic thin layer were measured in the microwave domain using different electromagnetic characterization methods. Complementary experimental techniques (broadband methods versus resonant techniques, waveguide versus transmission line) and complementary data processing procedures (quasi-static theoretical approaches versus full-wave analysis) were selected to investigate the best way to characterize ferroelectric thin films. The measured data obtained from the cylindrical resonant cavity method, the experimental method that showed the least sources of uncertainty, were taken as reference values for comparisons with results obtained using broadband techniques. The error analysis on the methods used is discussed with regard to the respective domains of validity for each method; this enabled us to identify the best experimental approach for obtaining an accurate determination of the microwave dielectric properties of ferroelectric thin layers.