Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2013Local structure of amorphous GaN1-xAsx semiconductor alloys across the composition range6citations
  • 2013Microstructure of Mg doped GaNAs alloys1citations
  • 2012Structural studies of GaN 1-x As x and GaN 1-x Bi x alloys for solar cell applications3citations
  • 2011GaNAs alloys over the whole composition range grown on crystalline and amorphous substrates9citations
  • 2010GaN1-xBix34citations
  • 2010Low gap amorphous GaN1-x Asx alloys grown on glass substrate19citations

Places of action

Chart of shared publication
Liliental-Weber, Z.
5 / 25 shared
Walukiewicz, W.
6 / 87 shared
Foxon, C. T.
6 / 36 shared
Wu, J.
5 / 56 shared
Dubon, O. D.
4 / 40 shared
Novikov, S. V.
6 / 22 shared
Reis, R. D.
1 / 1 shared
Reis, R. Dos
1 / 3 shared
Dubon, O.
1 / 1 shared
Luckert, F.
1 / 3 shared
Martin, R. W.
1 / 11 shared
Broesler, R.
2 / 8 shared
Tseng, A.
1 / 1 shared
Kao, V. M.
1 / 2 shared
Chart of publication period
2013
2012
2011
2010

Co-Authors (by relevance)

  • Liliental-Weber, Z.
  • Walukiewicz, W.
  • Foxon, C. T.
  • Wu, J.
  • Dubon, O. D.
  • Novikov, S. V.
  • Reis, R. D.
  • Reis, R. Dos
  • Dubon, O.
  • Luckert, F.
  • Martin, R. W.
  • Broesler, R.
  • Tseng, A.
  • Kao, V. M.
OrganizationsLocationPeople

article

Local structure of amorphous GaN1-xAsx semiconductor alloys across the composition range

  • Levander, A. X.
  • Liliental-Weber, Z.
  • Walukiewicz, W.
  • Foxon, C. T.
  • Wu, J.
  • Dubon, O. D.
  • Novikov, S. V.
Abstract

Typically only dilute (up to ∼10%) highly mismatched alloys can be grown due to the large differences in atomic size and electronegativity of the host and the alloying elements. We have overcome the miscibility gap of the GaN<sub>1-x</sub>As<sub>x</sub> system using low temperature molecular beam epitaxy. In the intermediate composition range (0.10 &lt;x &lt;0.75), the resulting alloys are amorphous. To gain a better understanding of the amorphous structure, the local environment of the As and Ga atoms was investigated using extended x-ray absorption fine structure (EXAFS). The EXAFS analysis shows a high concentration of dangling bonds compared to the crystalline binary endpoint compounds of the alloy system. The disorder parameter was larger for amorphous films compared to crystalline references, but comparable with other amorphous semiconductors. By examining the Ga local environment, the dangling bond density and disorder associated with As-related and N-related bonds could be decoupled. The N-related bonds had a lower dangling bond density and lower disorder. © 2013 AIP Publishing LLC.

Topics
  • density
  • compound
  • amorphous
  • semiconductor
  • extended X-ray absorption fine structure spectroscopy
  • liquid-liquid chromatography