Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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Singh, Chandra Bhal

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (13/13 displayed)

  • 2022Control of Layering in Aurivillius Phase Nanocomposite Thin Films and Influence on Ferromagnetism and Optical Absorption10citations
  • 2020Impact of Samarium on the growth of epitaxial Bismuth ferrite thin filmscitations
  • 2020Impact of Samarium on the Growth of Epitaxial Bismuth Ferrite Thin Films7citations
  • 2020Nanocomposites with Three-Dimensional Architecture and Impact on Photovoltaic Effect13citations
  • 2019Synthesis and dielectric characterization of BaZrNb2O8 high temperature piezoelectric ceramicscitations
  • 2019Structural, dielectric, semiconducting and optical properties of high-energy ball milled YFeO3 nano-particlescitations
  • 2018Development of Textured Electrode, Index Matching Layer and Nanostructured Materials for Light Trapping inside Photovoltaic devices3citations
  • 2018Effect of grain size on structural and dielectric properties of barium titanate piezoceramics synthesized by high energy ball milling9citations
  • 2014Effect of Substrate Temperature Variation and Tartarization on micro-Structural and Optical Properties of Pulsed DC Sputtered Hydrogenated ZnO: Al Films1citations
  • 2013Application of SixNy:Hz (SiN) as index matching layer in a-Si:H thin film solar cells13citations
  • 2013Raman and FTIR Studies on PECVD Grown Ammonia-Free Amorphous Silicon Nitride Thin Films for Solar Cell Applications15citations
  • 2013Optical and Structural Properties of Ammonia-Free Amorphous Silicon Nitride Thin Films for Photovoltaic Applications10citations
  • 2012Ion-induced secondary electrons emission measurement from MgO films deposited on multiwalled carbon nanotubes5citations

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Chart of shared publication
Himcinschi, Cameliu
2 / 8 shared
Singh, Akhilesh Kumar
5 / 7 shared
Bhatnagar, Akash
4 / 8 shared
Fina, Ignasi
1 / 28 shared
Mühlenbein, Lutz
2 / 6 shared
Lotnyk, Andriy
2 / 20 shared
Hähnel, Angelika
2 / 5 shared
Hagendorf, Christian
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Campbell, Sade
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Knoche, David S.
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Ramakrishnegowda, Niranjan
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Yun, Yeseul
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Li, Xinye
1 / 1 shared
Verma, Narendra Kumar
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Kamde, Garima
1 / 1 shared
Verma, N. K.
1 / 1 shared
Bhattacharya, S.
3 / 15 shared
Sarkar, Surajit
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Singh, Vandana
4 / 4 shared
Patel, Sandeep K. S.
1 / 1 shared
Bhavanasi, Venkateswarlu
1 / 1 shared
Ahmad, Nafis
1 / 1 shared
Bhargav, P. Balaji
3 / 3 shared
Ahmed, Nafis
2 / 2 shared
Dhara, Sandip
2 / 2 shared
Bhattacharya, S. K.
1 / 1 shared
Ram, Sanjay K.
1 / 2 shared
Kumar, Satyendra
1 / 1 shared
Chart of publication period
2022
2020
2019
2018
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2012

Co-Authors (by relevance)

  • Himcinschi, Cameliu
  • Singh, Akhilesh Kumar
  • Bhatnagar, Akash
  • Fina, Ignasi
  • Mühlenbein, Lutz
  • Lotnyk, Andriy
  • Hähnel, Angelika
  • Hagendorf, Christian
  • Campbell, Sade
  • Knoche, David S.
  • Ramakrishnegowda, Niranjan
  • Yun, Yeseul
  • Li, Xinye
  • Verma, Narendra Kumar
  • Kamde, Garima
  • Verma, N. K.
  • Bhattacharya, S.
  • Sarkar, Surajit
  • Singh, Vandana
  • Patel, Sandeep K. S.
  • Bhavanasi, Venkateswarlu
  • Ahmad, Nafis
  • Bhargav, P. Balaji
  • Ahmed, Nafis
  • Dhara, Sandip
  • Bhattacharya, S. K.
  • Ram, Sanjay K.
  • Kumar, Satyendra
OrganizationsLocationPeople

article

Application of SixNy:Hz (SiN) as index matching layer in a-Si:H thin film solar cells

  • Bhattacharya, S.
  • Bhavanasi, Venkateswarlu
  • Ahmad, Nafis
  • Bhargav, P. Balaji
  • Sarkar, Surajit
  • Singh, Vandana
  • Singh, Chandra Bhal
Abstract

The difference in refractive indices of glass substrate and transparent conducting oxide (TCO) electrode causes optical reflection in thin film solar cells, which results in lower absorption of light for devices. An anti-reflection layer between glass and TCO is required to reduce the loss of light due to optical reflection. Silicon nitride (SixNy:Hz) films have shown antireflection property. The refractive index of SixNy:Hz films can be engineered by changing the silicon or nitrogen content in the film. Here, we report the optimization of refractive index of SixNy:Hz to achieve a value between refractive index of glass (1.5) and TCO film (2.0). SixNy:Hz films have been deposited in a RF-plasma enhanced chemical vapour deposition system operating at a frequency of 13.56 MHz. The substrate temperature was fixed at 300 °C. Fourier transform infrared analysis has been used to determine the nature of Si-N, N-H, and Si-H bonding in the films. Refractive index of films has been measured using spectroscopic ellipsometer. The optical reflectance and transmission of SixNy:Hz and SixNy:Hz/TCO layers have been measured using UV/VIS spectrometer. The gas flow rate ratio of N2/SiH4 has been varied from 235 to 470. Decrease in transmittance of SixNy:Hz/TCO layer is observed with increase in silicon concentration in the film. Refractive index of SixNy:Hz also increased with an increase of the silicon content in the films. The reflectance of TCO films has been decreased from 15% to 8% when SixNy:Hz film is incorporated between glass substrate and TCO film. An improvement of around 20% has been observed in current density of solar cells having SixNy:Hz film as refractive index matching layer with refractive index 1.83. Thus, SixNy:Hz film as refractive index matching layer can be used to improve the solar cells device efficiency. Published version

Topics
  • Deposition
  • density
  • impedance spectroscopy
  • thin film
  • glass
  • glass
  • Nitrogen
  • nitride
  • Silicon
  • current density