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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Ren, W.
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Topics
Publications (9/9 displayed)
- 2020Oxygen octahedral tilt ordering in (Na1/2Bi1/2)TiO3 ferroelectric thin filmscitations
- 2018Graphitization of amorphous carbon by swift heavy ion impactscitations
- 2018Graphitization of amorphous carbon by swift heavy ion impacts : Molecular dynamics simulationcitations
- 2017In-situ X-ray computed tomography characterisation of 3D fracture evolution and image-based numerical homogenisation of concretecitations
- 2016In-situ X-ray computed tomography characterisation of 3D fracture evolution and image-based numerical homogenisation of concretecitations
- 2015Modification of Pt/Co/Pt film properties by ion irradiationcitations
- 2014Control of ferroelectricity and magnetism in multi-ferroic BiFeO3 by epitaxial straincitations
- 2014Control of ferroelectricity and magnetism in multi-ferroic BiFeO3 by epitaxial straincitations
- 2013Full field electron spectromicroscopy applied to ferroelectric materialscitations
Places of action
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article
Full field electron spectromicroscopy applied to ferroelectric materials
Abstract
The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented.