Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2022Predicting Solar Cell Performance from Terahertz and Microwave Spectroscopy66citations
  • 2022Predicting Solar Cell Performance from Terahertz and Microwave Spectroscopy66citations
  • 2022Predicting solar cell performance from terahertz and microwave spectroscopy66citations
  • 2013Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO<sub>3</sub> thin films on DyScO<sub>3</sub> substrates39citations

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Neu, Jens
3 / 3 shared
Failla, M.
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Stolterfoht, Martin
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Paingad, Vaisakh C.
3 / 3 shared
Savenije, T. J.
1 / 12 shared
Hempel, Hannes
3 / 11 shared
Siebbeles, L. D. A.
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Zhao, J.
1 / 34 shared
Bernhagen, Margitta
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Haislmaier, Ryan
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Skoromets, Volodymyr
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Xi, Xiaoxing
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Schlom, Darrell G.
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Lee, Che-Hui
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Uecker, Reinhard
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Kamba, Stanislav
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Biegalski, Michael D.
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Martí, Xavier
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2013

Co-Authors (by relevance)

  • Neu, Jens
  • Failla, M.
  • Stolterfoht, Martin
  • Paingad, Vaisakh C.
  • Savenije, T. J.
  • Hempel, Hannes
  • Siebbeles, L. D. A.
  • Zhao, J.
  • Bernhagen, Margitta
  • Haislmaier, Ryan
  • Skoromets, Volodymyr
  • Xi, Xiaoxing
  • Schlom, Darrell G.
  • Lee, Che-Hui
  • Uecker, Reinhard
  • Lei, Shiming
  • Gopalan, Venkatraman
  • Kamba, Stanislav
  • Biegalski, Michael D.
  • Martí, Xavier
OrganizationsLocationPeople

article

Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO<sub>3</sub> thin films on DyScO<sub>3</sub> substrates

  • Bernhagen, Margitta
  • Haislmaier, Ryan
  • Skoromets, Volodymyr
  • Xi, Xiaoxing
  • Schlom, Darrell G.
  • Lee, Che-Hui
  • Kužel, Petr
  • Uecker, Reinhard
  • Lei, Shiming
  • Gopalan, Venkatraman
  • Kamba, Stanislav
  • Biegalski, Michael D.
  • Martí, Xavier
Abstract

The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr<sub>1+x</sub>TiO<sub>3+ δ</sub> films grown on DyScO<sub>3</sub> substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO<sub>3</sub> films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO<sub>3</sub> matrix.

Topics
  • impedance spectroscopy
  • dispersion
  • thin film
  • defect