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Lee, Che-Hui
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article
Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO<sub>3</sub> thin films on DyScO<sub>3</sub> substrates
Abstract
The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr<sub>1+x</sub>TiO<sub>3+ δ</sub> films grown on DyScO<sub>3</sub> substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO<sub>3</sub> films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO<sub>3</sub> matrix.