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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Dittmann, R.
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Topics
Publications (13/13 displayed)
- 2021Functional Modifications Induced via X-ray Nanopatterning in TiO2 Rutile Single Crystalscitations
- 2019Chemical control of the electrical surface properties in donor-doped transition metal oxidescitations
- 2019Towards Oxide Electronics:a Roadmapcitations
- 2018Charge-transfer in B-site-depleted NdGaO3/SrTiO3 heterostructurescitations
- 2015Impact of the cation-stoichiometry on the resistive switching and data retention of SrTiO3 thin filmscitations
- 2015Impact of the cation-stoichiometry on the resistive switching and data retention of SrTiO$_{3}$ thin filmscitations
- 2014Band alignment at memristive metal-oxide interfaces investigated by hard x-ray photoemission spectroscopycitations
- 2013Nonstoichiometry accommodation in SrTiO3 thin films studied by positron annihilation and electron microscopycitations
- 2013Feasibility studies for filament detection in resistively switching SrTiO3 devices by employing grazing incidence small angle X-ray scatteringcitations
- 2013Feasibility studies for filament detection in resistively switching $SrTiO_{3}$ devices by employing grazing incidence small angle X-ray scatteringcitations
- 2011Bipolar resistive switching in oxides: mechanisms and scalingcitations
- 2009Loadable TiO 2 scaffolds - a correlation study between processing parameters, micro CT analysis and mechanical strengthcitations
- 2007Highly sinter-active (Mg-Cu)-Zn ferrite nanoparticles prepared by flame spray synthesiscitations
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article
Feasibility studies for filament detection in resistively switching SrTiO3 devices by employing grazing incidence small angle X-ray scattering
Abstract
<p>We report on fundamental studies of grazing incidence small angle X-ray scattering (GISAXS) on resistively switching SrTiO<sub>3</sub> thin film metal-insulator-metal (MIM) devices. Different influence factors on the GISAXS scattering pattern, e.g., surface morphology and top electrode material, were evaluated by simulations and compared with subsequent measurements. Pt top electrodes cause a strong background scattering which covers any information from the underlying SrTiO<sub>3</sub> layer. In order to reduce this undesired background scattering, the lighter elements Al and Ti have been used. In case of Ti top electrodes, we observed that a laterally formed structure occurs in the SrTiO<sub>3</sub> prior to any electrical treatment, which is consistent with the forming-free properties of the MIM structures. For Al top electrodes, we could detect a significant influence of an electroforming step on the scattered intensity.</p>