Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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University of Manchester

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2017Improved retention of phosphorus donors in germanium using a non-amorphizing fluorine co-implantation technique6citations
  • 2013Donor ionization in size controlled silicon nanocrystals: The transition from defect passivation to free electron generation10citations
  • 2013Size limit on the phosphorous doped silicon nanocrystals for dopant activation7citations
  • 2010Formation of Si-nanocrystals in SiO2 via ion implantation and rapid thermal processing1citations

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Chart of shared publication
Shah, M.
2 / 7 shared
Knights, Ap
1 / 2 shared
Hylton, Np
1 / 1 shared
Hulko, O.
2 / 2 shared
Papachristodoulou, N.
2 / 2 shared
Yang, P.
2 / 4 shared
Gwilliam, Rm
1 / 3 shared
Kenyon, Aj
1 / 10 shared
Halsall, Mp
3 / 8 shared
Hylton, N. P.
1 / 2 shared
Gwilliam, R. M.
1 / 10 shared
Kenyon, A. J.
1 / 4 shared
Knights, A. P.
1 / 4 shared
Ruffell, Simon
1 / 5 shared
Hylton, Nicholas P.
1 / 2 shared
Hulko, Oksana
1 / 1 shared
Knights, Andrew P.
1 / 3 shared
Gwilliam, Russell M.
1 / 5 shared
Chart of publication period
2017
2013
2010

Co-Authors (by relevance)

  • Shah, M.
  • Knights, Ap
  • Hylton, Np
  • Hulko, O.
  • Papachristodoulou, N.
  • Yang, P.
  • Gwilliam, Rm
  • Kenyon, Aj
  • Halsall, Mp
  • Hylton, N. P.
  • Gwilliam, R. M.
  • Kenyon, A. J.
  • Knights, A. P.
  • Ruffell, Simon
  • Hylton, Nicholas P.
  • Hulko, Oksana
  • Knights, Andrew P.
  • Gwilliam, Russell M.
OrganizationsLocationPeople

article

Donor ionization in size controlled silicon nanocrystals: The transition from defect passivation to free electron generation

  • Shah, M.
  • Knights, Ap
  • Hylton, Np
  • Crowe, If
  • Hulko, O.
  • Papachristodoulou, N.
  • Yang, P.
  • Gwilliam, Rm
  • Kenyon, Aj
  • Halsall, Mp
Abstract

We studied the photoluminescence spectra of silicon and phosphorus co-implanted silica thin films on (100) silicon substrates as a function of isothermal annealing time. The rapid phase segregation, formation, and growth dynamics of intrinsic silicon nanocrystals are observed, in the first 600 s of rapid thermal processing, using dark field mode X-TEM. For short annealing times, when the nanocrystal size distribution exhibits a relatively small mean diameter, formation in the presence of phosphorus yields an increase in the luminescence intensity and a blue shift in the emission peak compared with intrinsic nanocrystals. As the mean size increases with annealing time, this enhancement rapidly diminishes and the peak energy shifts further to the red than the intrinsic nanocrystals. These results indicate the existence of competing pathways for the donor electron, which depends strongly on the nanocrystal size. In samples containing a large density of relatively small nanocrystals, the tendency of phosphorus to accumulate at the nanocrystal-oxide interface means that ionization results in a passivation of dangling bond (Pb-centre) type defects, through a charge compensation mechanism. As the size distribution evolves with isothermal annealing, the density of large nanocrystals increases at the expense of smaller nanocrystals, through an Ostwald ripening mechanism, and the majority of phosphorus atoms occupy substitutional lattice sites within the nanocrystals. As a consequence of the smaller band-gap, ionization of phosphorus donors at these sites increases the free carrier concentration and opens up an efficient, non-radiative de-excitation route for photo-generated electrons via Auger recombination. This effect is exacerbated by an enhanced diffusion in phosphorus doped glasses, which accelerates silicon nanocrystal growth. © 2013 American Institute of Physics.

Topics
  • density
  • impedance spectroscopy
  • photoluminescence
  • phase
  • thin film
  • glass
  • glass
  • transmission electron microscopy
  • Silicon
  • defect
  • annealing
  • Phosphorus
  • Ostwald ripening