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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Muecklich, A.
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Publications (5/5 displayed)
- 2012Focused ion beam induced structural modifications in thin magnetic filmscitations
- 2008The interfacial diffusion zone in magnetron sputtered Ni-Ti thin films deposited on different Si substrates studied by HR-TEMcitations
- 2008Study of graded Ni-Ti shape memory alloy film growth on Si(100) substratecitations
- 2008Characterization of Sputtered Shape Memory Alloy Ni-Ti Films by Cross-sectional TEM and SEM
- 2007Nucleation and growth of Ti2AlN thin films deposited by reactive magnetron sputtering onto MgO(111)citations
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article
Focused ion beam induced structural modifications in thin magnetic films
Abstract
<p>Focused ion beam techniques are one way to modify locally the properties of magnetic thin films. We report on structural investigations of 50 nm thick non-ordered nano-crystalline Permalloy (Ni <sub>81</sub>Fe <sub>19</sub>) films modified by 30 keV Ga <sup>+</sup> focused ion beam (FIB) irradiation. From the x-ray diffraction (XRD) measurements a considerable crystallite growth and a material texturing towards (111)-direction with a linearly increasing lattice constant was observed. In addition, cross-sectional transmission electron microscope (XTEM) images show that crystallites are growing through the entire film at high irradiation fluences. Extended x-ray absorption fine structure (EXAFS) analysis shows a perfect near-order coordination corresponding to a face-centered (fcc) unit cell for both Fe, Ni and Ga atom surrounding. The structural changes are accompanied by a decrease of saturation polarization with increasing ion fluence. Such a behavior is attributed to the incorporation of non-magnetic Ga atoms in the Permalloy film.</p>