Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2012Low-temperature, site selective graphitization of SiC via ion implantation and pulsed laser annealing21citations

Places of action

Chart of shared publication
Venkatachalam, Dinesh K.
1 / 2 shared
Wang, Xiaotie
1 / 2 shared
Tongay, Sefaattin
1 / 9 shared
Appleton, Bill R.
1 / 2 shared
Gila, Brent P.
1 / 2 shared
Ren, Fan
1 / 5 shared
Hebard, Arthur F.
1 / 2 shared
Fridmann, Joel
1 / 2 shared
Chart of publication period
2012

Co-Authors (by relevance)

  • Venkatachalam, Dinesh K.
  • Wang, Xiaotie
  • Tongay, Sefaattin
  • Appleton, Bill R.
  • Gila, Brent P.
  • Ren, Fan
  • Hebard, Arthur F.
  • Fridmann, Joel
OrganizationsLocationPeople

article

Low-temperature, site selective graphitization of SiC via ion implantation and pulsed laser annealing

  • Venkatachalam, Dinesh K.
  • Wang, Xiaotie
  • Lemaitre, Maxime G.
  • Tongay, Sefaattin
  • Appleton, Bill R.
  • Gila, Brent P.
  • Ren, Fan
  • Hebard, Arthur F.
  • Fridmann, Joel
Abstract

<p>A technique is presented to selectively graphitize regions of SiC by ion implantation and pulsed laser annealing (PLA). Nanoscale features are patterned over large areas by multi-ion beam lithography and subsequently converted to few-layer graphene via PLA in air. Graphitization occurs only where ions have been implanted and without elevating the temperature of the surrounding substrate. Samples were characterized using Raman spectroscopy, ion scattering/channeling, SEM, and AFM, from which the degree of graphitization was determined to vary with implantation species, damage and dose, laser fluence, and pulsing. Contrasting growth regimes and graphitization mechanisms during PLA are discussed.</p>

Topics
  • impedance spectroscopy
  • scanning electron microscopy
  • atomic force microscopy
  • annealing
  • Raman spectroscopy
  • lithography
  • ion scattering