Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2011Extended x-ray absorption fine structure study of porous GaSb formed by ion implantation20citations
  • 2006Structural stability of Cu nanocrystals in SiO2 exposed to high-energy ion irradiation8citations
  • 2005EXAFS comparison of crystalline/continuous and amorphous/porous GaSb8citations

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Chart of shared publication
Johannessen, B.
3 / 12 shared
Ridgway, M. C.
3 / 38 shared
Glover, C. J.
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Foran, G. J.
3 / 17 shared
Cookson, D. J.
1 / 7 shared
Llewellyn, D. J.
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2011
2006
2005

Co-Authors (by relevance)

  • Johannessen, B.
  • Ridgway, M. C.
  • Glover, C. J.
  • Foran, G. J.
  • Cookson, D. J.
  • Llewellyn, D. J.
OrganizationsLocationPeople

article

Extended x-ray absorption fine structure study of porous GaSb formed by ion implantation

  • Johannessen, B.
  • Ridgway, M. C.
  • Glover, C. J.
  • Kluth, S. M.
  • Foran, G. J.
Abstract

<p>Porous GaSb has been formed by Ga ion implantation into crystalline GaSb substrates at either room temperature or -180 C. The morphology has been characterized using scanning electron microscopy and the atomic structure was determined using extended x-ray absorption fine structure spectroscopy. Room-temperature implantation at low fluences leads to the formation of ∼20-nm voids though the material remains crystalline. Higher fluences cause the microstructure to evolve into a network of amorphous GaSb rods ∼15 nm in diameter. In contrast, implantation at -180 C generates large, elongated voids but no rods. Upon exposure to air, the surface of the porous material is readily oxidized yielding Ga <sub>2</sub>O <sub>3</sub> and metallic Sb precipitates, the latter resulting from the reduction of unstable Sb <sub>2</sub>O <sub>3</sub>. We consider and discuss the atomic-scale mechanisms potentially operative during the concurrent crystalline-to-amorphous and continuous-to-porous transformations.</p>

Topics
  • porous
  • impedance spectroscopy
  • surface
  • amorphous
  • scanning electron microscopy
  • precipitate
  • void
  • extended X-ray absorption fine structure spectroscopy