• Ruffell, S.
• Williams, J. S.
• Knights, A. P.

Abstract

<p>We demonstrate that nanoindents formed in amorphous Si films, with dimensions as small as ∼20 nm, provide a means to seed solid phase crystallization. During post-indentation annealing at ∼600 °C, solid phase crystallization initiates from the indented sites, effectively removing the incubation time for random nucleation in the absence of seeds. The seeded crystallization is studied by optical microscopy, cross-sectional transmission electron microscopy, and electrical characterization via Hall measurements. Full crystallization can be achieved, with improved electrical characteristics attributed to the improved microstructure, using a lower thermal budget. The process is metal contaminant free and allows for selective area crystallization.</p>

Topics

• impedance spectroscopy
• microstructure
• amorphous
• phase
• nanoindentation
• transmission electron microscopy
• Silicon
• annealing
• random
• optical microscopy
• crystallization