Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2011Dielectric dispersion of BaSrTiO3 thin film from centimeter to submillimeter wavelengths14citations
  • 2007Electrical characterizations of paraelectric BST thin films up to 1 THz : realization of microwave phase shifters9citations

Places of action

Chart of shared publication
Lippens, Didier
2 / 8 shared
Burgnies, Ludovic
2 / 7 shared
Mounaix, Patrick
2 / 15 shared
Vélu, Gabriel
2 / 6 shared
Carru, Jean-Claude
2 / 24 shared
Blary, Karine
2 / 6 shared
Lepilliet, Sylvie
1 / 3 shared
Houzet, Grégory
1 / 5 shared
Marteau, Aurélien
1 / 3 shared
Tondusson, Marc
1 / 4 shared
Houzet, Gregory
1 / 6 shared
Chart of publication period
2011
2007

Co-Authors (by relevance)

  • Lippens, Didier
  • Burgnies, Ludovic
  • Mounaix, Patrick
  • Vélu, Gabriel
  • Carru, Jean-Claude
  • Blary, Karine
  • Lepilliet, Sylvie
  • Houzet, Grégory
  • Marteau, Aurélien
  • Tondusson, Marc
  • Houzet, Gregory
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article

Dielectric dispersion of BaSrTiO3 thin film from centimeter to submillimeter wavelengths

  • Lippens, Didier
  • Burgnies, Ludovic
  • Mounaix, Patrick
  • Agnandji, Edwin Nguema
  • Vélu, Gabriel
  • Carru, Jean-Claude
  • Blary, Karine
  • Lepilliet, Sylvie
  • Houzet, Grégory
Abstract

The dielectric dispersion of ferroelectric BaxSr1-xTiO3 (BST) thin film in a paraelectric phase was characterized from centimeter to submillimeter wavelengths. To this aim, interdigitated capacitors were patterned on a micrometer scale onto a BST layer with a barium concentration of 0.5 and were subsequently integrated by using a coplanar waveguide technology. The retrieval of the complex permittivity of BST was performed by vectorial scattering parameter measurements up to 190 GHz for various controlling dc field up to 300 kV/cm. At higher frequency, submillimeter wavelength measurements were performed by time domain spectroscopy under free space condition. On this basis, the dispersion of the real part of the permittivity along with the loss tangent are retrieved in agreement with a distributed interaction of ac-field with soft phonons vibration modes, and overlapping between dipole polarization and ionic polarization is observed, around 700 GHz. It is also shown that dipole polarization can be attributed to the presence of small polar nanoregions in the BST film which act as in ferroelectric material with diffuse phase transition. (c) 2011 American Institute of Physics. [doi:10.1063/1.3531534]

Topics
  • impedance spectroscopy
  • dispersion
  • phase
  • thin film
  • phase transition
  • dielectric dispersion
  • Barium